Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Angus I. Kirkland, Peter D. Nellist, Lan-Yun Chang, Sarah J. Haigh

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Citations (Scopus)

Abstract

The review and comparison of the operation of aberration corrected instruments in the CTEM and STEM configurations is discussed. Electron optical correctors provide significant control over many other aberrations and introduce certain higher-order aberrations along with correction of the spherical aberration. The image aberration is defined as the differential of the wave aberration function, which is calculated as the distance between the aberrated and ideal wave surfaces in the diffraction plane. The influence of lens aberrations in CTEM image formation can be described by multiplying the electron wave in reciprocal space. Aberration measurement methods for STEM also include to tilt the illuminating beam through the corrector while using a relatively small beam-limiting aperture such that different illumination angles are explored.

Original languageEnglish (US)
Title of host publicationAdvances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy
EditorsPeter Hawkes
Pages283-325
Number of pages43
DOIs
StatePublished - Dec 1 2008
Externally publishedYes

Publication series

NameAdvances in Imaging and Electron Physics
Volume153
ISSN (Print)1076-5670

Fingerprint

Aberrations
aberration
Transmission electron microscopy
Imaging techniques
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy
Electrons
illuminating
Surface waves
surface waves
Lenses
Image processing
electrons
Diffraction
Lighting
apertures
illumination
lenses
configurations

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Kirkland, A. I., Nellist, P. D., Chang, L-Y., & Haigh, S. J. (2008). Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. In P. Hawkes (Ed.), Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy (pp. 283-325). (Advances in Imaging and Electron Physics; Vol. 153). https://doi.org/10.1016/S1076-5670(08)01008-2

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. / Kirkland, Angus I.; Nellist, Peter D.; Chang, Lan-Yun; Haigh, Sarah J.

Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy. ed. / Peter Hawkes. 2008. p. 283-325 (Advances in Imaging and Electron Physics; Vol. 153).

Research output: Chapter in Book/Report/Conference proceedingChapter

Kirkland, AI, Nellist, PD, Chang, L-Y & Haigh, SJ 2008, Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. in P Hawkes (ed.), Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy. Advances in Imaging and Electron Physics, vol. 153, pp. 283-325. https://doi.org/10.1016/S1076-5670(08)01008-2
Kirkland AI, Nellist PD, Chang L-Y, Haigh SJ. Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. In Hawkes P, editor, Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy. 2008. p. 283-325. (Advances in Imaging and Electron Physics). https://doi.org/10.1016/S1076-5670(08)01008-2
Kirkland, Angus I. ; Nellist, Peter D. ; Chang, Lan-Yun ; Haigh, Sarah J. / Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy. editor / Peter Hawkes. 2008. pp. 283-325 (Advances in Imaging and Electron Physics).
@inbook{3b656bb0a4df407cb62dbeaa47ede3d8,
title = "Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy",
abstract = "The review and comparison of the operation of aberration corrected instruments in the CTEM and STEM configurations is discussed. Electron optical correctors provide significant control over many other aberrations and introduce certain higher-order aberrations along with correction of the spherical aberration. The image aberration is defined as the differential of the wave aberration function, which is calculated as the distance between the aberrated and ideal wave surfaces in the diffraction plane. The influence of lens aberrations in CTEM image formation can be described by multiplying the electron wave in reciprocal space. Aberration measurement methods for STEM also include to tilt the illuminating beam through the corrector while using a relatively small beam-limiting aperture such that different illumination angles are explored.",
author = "Kirkland, {Angus I.} and Nellist, {Peter D.} and Lan-Yun Chang and Haigh, {Sarah J.}",
year = "2008",
month = "12",
day = "1",
doi = "10.1016/S1076-5670(08)01008-2",
language = "English (US)",
isbn = "9780123742209",
series = "Advances in Imaging and Electron Physics",
pages = "283--325",
editor = "Peter Hawkes",
booktitle = "Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy",

}

TY - CHAP

T1 - Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

AU - Kirkland, Angus I.

AU - Nellist, Peter D.

AU - Chang, Lan-Yun

AU - Haigh, Sarah J.

PY - 2008/12/1

Y1 - 2008/12/1

N2 - The review and comparison of the operation of aberration corrected instruments in the CTEM and STEM configurations is discussed. Electron optical correctors provide significant control over many other aberrations and introduce certain higher-order aberrations along with correction of the spherical aberration. The image aberration is defined as the differential of the wave aberration function, which is calculated as the distance between the aberrated and ideal wave surfaces in the diffraction plane. The influence of lens aberrations in CTEM image formation can be described by multiplying the electron wave in reciprocal space. Aberration measurement methods for STEM also include to tilt the illuminating beam through the corrector while using a relatively small beam-limiting aperture such that different illumination angles are explored.

AB - The review and comparison of the operation of aberration corrected instruments in the CTEM and STEM configurations is discussed. Electron optical correctors provide significant control over many other aberrations and introduce certain higher-order aberrations along with correction of the spherical aberration. The image aberration is defined as the differential of the wave aberration function, which is calculated as the distance between the aberrated and ideal wave surfaces in the diffraction plane. The influence of lens aberrations in CTEM image formation can be described by multiplying the electron wave in reciprocal space. Aberration measurement methods for STEM also include to tilt the illuminating beam through the corrector while using a relatively small beam-limiting aperture such that different illumination angles are explored.

UR - http://www.scopus.com/inward/record.url?scp=67649405008&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=67649405008&partnerID=8YFLogxK

U2 - 10.1016/S1076-5670(08)01008-2

DO - 10.1016/S1076-5670(08)01008-2

M3 - Chapter

AN - SCOPUS:67649405008

SN - 9780123742209

T3 - Advances in Imaging and Electron Physics

SP - 283

EP - 325

BT - Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy

A2 - Hawkes, Peter

ER -