CHAPTER 1: Characterization of nanomaterials using transmission electron microscopy

Research output: Chapter in Book/Report/Conference proceedingChapter

6 Scopus citations

Abstract

The transmission electron microscope (TEM) is the perfect instrument for structural and chemical characterization at the nanoscale. Imaging, diffraction and microanalytical information are easily produced and then combined to give detailed insights into the properties and behavior of nanostructured materials. This chapter begins with an introduction to imaging modes and several other important aspects of high-resolution imaging, including the development of aberration correction for electron microscopy. Typical examples ranging from nanoparticles to quantum wells, nanowires and quantum dots are then briefly described to illustrate the diverse range of applications of the TEM to studying nanomaterials. Finally, emerging trends and practical concerns that continue to impact the success of electron microscopy studies are briefly discussed.

Original languageEnglish (US)
Title of host publicationHierarchical Nanostructures for Energy Devices
EditorsAngus I. Kirkland, Sarah J. Haigh
PublisherRoyal Society of Chemistry
Pages1-29
Number of pages29
Edition37
ISBN (Electronic)9781849736282, 9781849736374, 9781849738057
DOIs
StatePublished - Jan 1 2015

Publication series

NameRSC Nanoscience and Nanotechnology
Number37
Volume2015-January
ISSN (Print)1757-7136
ISSN (Electronic)1757-7144

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ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Engineering(all)

Cite this

Smith, D. (2015). CHAPTER 1: Characterization of nanomaterials using transmission electron microscopy. In A. I. Kirkland, & S. J. Haigh (Eds.), Hierarchical Nanostructures for Energy Devices (37 ed., pp. 1-29). (RSC Nanoscience and Nanotechnology; Vol. 2015-January, No. 37). Royal Society of Chemistry. https://doi.org/10.1039/9781782621867-00001