Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM

J. M. Gibson; Michael Treacy; P. M. Voyles; J. R. Abelson; H. C. Jin

Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM

J. M. Gibson, Michael Treacy, P. M. Voyles, J. R. Abelson, H. C. Jin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We have investigated the structure of α-Si:H thin films using variable coherence transmission electron microscopy. Variable coherence is a new microscopy technique that is sensitive to higher-order atomic position correlations. We observe changes in the structure of α-Si:H with increasing hydrogen content and with light soaking. Based on these observations we conclude that a less ordered form of α-Si:H is more structurally stable than a more ordered form. This may have implications for understanding the Staebler-Wronski effect.

Original language	English (US)
Title of host publication	Materials Research Society Symposium - Proceedings
Editors	R. Schropp, H.M. Branz, M. Hack, I. Shimizu, S. Wagner
Publisher	MRS
Pages	837-842
Number of pages	6
Volume	507
State	Published - 1999
Externally published	Yes
Event	Proceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA Duration: Apr 14 1998 → Apr 17 1998

Other

Other	Proceedings of the 1998 MRS Spring Meeting
City	San Francisco, CA, USA
Period	4/14/98 → 4/17/98

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Cite this

Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM. / Gibson, J. M.; Treacy, Michael; Voyles, P. M. et al.
Materials Research Society Symposium - Proceedings. ed. / R. Schropp; H.M. Branz; M. Hack; I. Shimizu; S. Wagner. Vol. 507 MRS, 1999. p. 837-842.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Gibson, JM, Treacy, M, Voyles, PM, Abelson, JR & Jin, HC 1999, Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM. in R Schropp, HM Branz, M Hack, I Shimizu & S Wagner (eds), Materials Research Society Symposium - Proceedings. vol. 507, MRS, pp. 837-842, Proceedings of the 1998 MRS Spring Meeting, San Francisco, CA, USA, 4/14/98.

@inproceedings{0382adb7c14746dda5b16da46dd6a01c,

title = "Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM",

abstract = "We have investigated the structure of α-Si:H thin films using variable coherence transmission electron microscopy. Variable coherence is a new microscopy technique that is sensitive to higher-order atomic position correlations. We observe changes in the structure of α-Si:H with increasing hydrogen content and with light soaking. Based on these observations we conclude that a less ordered form of α-Si:H is more structurally stable than a more ordered form. This may have implications for understanding the Staebler-Wronski effect.",

author = "Gibson, {J. M.} and Michael Treacy and Voyles, {P. M.} and Abelson, {J. R.} and Jin, {H. C.}",

year = "1999",

language = "English (US)",

volume = "507",

pages = "837--842",

editor = "R. Schropp and H.M. Branz and M. Hack and I. Shimizu and S. Wagner",

booktitle = "Materials Research Society Symposium - Proceedings",

publisher = "MRS",

note = "Proceedings of the 1998 MRS Spring Meeting ; Conference date: 14-04-1998 Through 17-04-1998",

}

TY - GEN

T1 - Changes in the medium range order of α-Si

T2 - Proceedings of the 1998 MRS Spring Meeting

AU - Gibson, J. M.

AU - Treacy, Michael

AU - Voyles, P. M.

AU - Abelson, J. R.

AU - Jin, H. C.

PY - 1999

Y1 - 1999

N2 - We have investigated the structure of α-Si:H thin films using variable coherence transmission electron microscopy. Variable coherence is a new microscopy technique that is sensitive to higher-order atomic position correlations. We observe changes in the structure of α-Si:H with increasing hydrogen content and with light soaking. Based on these observations we conclude that a less ordered form of α-Si:H is more structurally stable than a more ordered form. This may have implications for understanding the Staebler-Wronski effect.

AB - We have investigated the structure of α-Si:H thin films using variable coherence transmission electron microscopy. Variable coherence is a new microscopy technique that is sensitive to higher-order atomic position correlations. We observe changes in the structure of α-Si:H with increasing hydrogen content and with light soaking. Based on these observations we conclude that a less ordered form of α-Si:H is more structurally stable than a more ordered form. This may have implications for understanding the Staebler-Wronski effect.

UR - http://www.scopus.com/inward/record.url?scp=0032663606&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032663606&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0032663606

VL - 507

SP - 837

EP - 842

BT - Materials Research Society Symposium - Proceedings

A2 - Schropp, R.

A2 - Branz, H.M.

A2 - Hack, M.

A2 - Shimizu, I.

A2 - Wagner, S.

PB - MRS

Y2 - 14 April 1998 through 17 April 1998

ER -

Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM

Abstract

Other

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this