Abstract
The semiconductor growth of CdTe(111)B on nominal Si(111) by molecular beam epitaxy using ZnTe buffer layers was investigated. Transmission electron microscopy image exhibited the structural quality of the films indicating a domain-free structure even in the initial stages of growth.
Original language | English (US) |
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Pages (from-to) | 2346-2348 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 74 |
Issue number | 16 |
DOIs | |
State | Published - Apr 19 1999 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)