CBED study of low-temperature InP grown by gas source MBE

R. Rajesh, M. J. Kim, J. S. Bow, Ray Carpenter, G. N. Maracas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages810-811
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

Fingerprint

Molecular beam epitaxy
Gases
Indium
Structural properties
Electric properties
Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Rajesh, R., Kim, M. J., Bow, J. S., Carpenter, R., & Maracas, G. N. (1993). CBED study of low-temperature InP grown by gas source MBE. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 810-811). Publ by San Francisco Press Inc.

CBED study of low-temperature InP grown by gas source MBE. / Rajesh, R.; Kim, M. J.; Bow, J. S.; Carpenter, Ray; Maracas, G. N.

Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. p. 810-811.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rajesh, R, Kim, MJ, Bow, JS, Carpenter, R & Maracas, GN 1993, CBED study of low-temperature InP grown by gas source MBE. in Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, pp. 810-811, Proceedings of the 51st Annual Meeting Microscopy Society of America, Cincinnati, OH, USA, 8/1/93.
Rajesh R, Kim MJ, Bow JS, Carpenter R, Maracas GN. CBED study of low-temperature InP grown by gas source MBE. In Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc. 1993. p. 810-811
Rajesh, R. ; Kim, M. J. ; Bow, J. S. ; Carpenter, Ray ; Maracas, G. N. / CBED study of low-temperature InP grown by gas source MBE. Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. pp. 810-811
@inproceedings{762571062d4840b687183bfa9fe6ba7c,
title = "CBED study of low-temperature InP grown by gas source MBE",
abstract = "Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.",
author = "R. Rajesh and Kim, {M. J.} and Bow, {J. S.} and Ray Carpenter and Maracas, {G. N.}",
year = "1993",
language = "English (US)",
pages = "810--811",
booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",
publisher = "Publ by San Francisco Press Inc",

}

TY - GEN

T1 - CBED study of low-temperature InP grown by gas source MBE

AU - Rajesh, R.

AU - Kim, M. J.

AU - Bow, J. S.

AU - Carpenter, Ray

AU - Maracas, G. N.

PY - 1993

Y1 - 1993

N2 - Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

AB - Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

UR - http://www.scopus.com/inward/record.url?scp=0027707298&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027707298&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027707298

SP - 810

EP - 811

BT - Proceedings - Annual Meeting, Microscopy Society of America

PB - Publ by San Francisco Press Inc

ER -