CBED study of low-temperature InP grown by gas source MBE

R. Rajesh; M. J. Kim; J. S. Bow; Ray Carpenter; G. N. Maracas

CBED study of low-temperature InP grown by gas source MBE

R. Rajesh, M. J. Kim, J. S. Bow, Ray Carpenter, G. N. Maracas

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Publisher	Publ by San Francisco Press Inc
Pages	810-811
Number of pages	2
State	Published - 1993
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

Other

Other	Proceedings of the 51st Annual Meeting Microscopy Society of America
City	Cincinnati, OH, USA
Period	8/1/93 → 8/6/93

ASJC Scopus subject areas

Engineering(all)

Cite this

@inproceedings{762571062d4840b687183bfa9fe6ba7c,

title = "CBED study of low-temperature InP grown by gas source MBE",

abstract = "Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.",

author = "R. Rajesh and Kim, {M. J.} and Bow, {J. S.} and Ray Carpenter and Maracas, {G. N.}",

year = "1993",

language = "English (US)",

pages = "810--811",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

publisher = "Publ by San Francisco Press Inc",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - GEN

T1 - CBED study of low-temperature InP grown by gas source MBE

AU - Rajesh, R.

AU - Kim, M. J.

AU - Bow, J. S.

AU - Carpenter, Ray

AU - Maracas, G. N.

PY - 1993

Y1 - 1993

N2 - Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

AB - Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

UR - http://www.scopus.com/inward/record.url?scp=0027707298&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027707298&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027707298

SP - 810

EP - 811

BT - Proceedings - Annual Meeting, Microscopy Society of America

PB - Publ by San Francisco Press Inc

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -

CBED study of low-temperature InP grown by gas source MBE

Abstract

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ASJC Scopus subject areas

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