CBED SHADOW IMAGES AND C//s: ABERRATION MEASUREMENT.

Ray Carpenter, I. Y T Chan, J. M. Cowley

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations
Original languageEnglish (US)
Title of host publicationProceedings - Electron Microscopy Society of America
PublisherClaitor's Publ Div
Pages696-697
Number of pages2
StatePublished - 1982
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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