Abstract
Successful application of SPC for monitoring and diagnosis in complex manufacturing systems is a challenging problem due to the excessive number of process/product variables and their intricate relationships. The T 2 decomposition approach [7] (called MTY approach), although popularly used, may receive concerns on its computational efficiency and capability of reliably identifying the root causes of the fault in a large complex system. This paper proposes a causation-based T 2 decomposition approach by effectively incorporating causal models into the MTY approach. Theoretical analysis and simulation studies demonstrate that the proposed causation-based T 2 decomposition has enhanced interpretability and diagnostic power.
Original language | English (US) |
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Title of host publication | 2006 IIE Annual Conference and Exhibition |
State | Published - 2006 |
Externally published | Yes |
Event | 2006 IIE Annual Conference and Exposition - Orlando, FL, United States Duration: May 20 2006 → May 24 2006 |
Other
Other | 2006 IIE Annual Conference and Exposition |
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Country/Territory | United States |
City | Orlando, FL |
Period | 5/20/06 → 5/24/06 |
Keywords
- Causal models
- Monitoring and diagnosis
- SPC
- T decomposition
ASJC Scopus subject areas
- Industrial and Manufacturing Engineering