Abstract
Alignment of InAs quantum dots was achieved by introducing misfit dislocations in a metastable InGaAs layer and subsequent annealing. Photoexcited carrier dynamics were studied using time-resolved photoluminescence. Comparison with control "non-aligned" In As quantum dots show remarkable differences in integrated photoluminescence intensities with excitation power and photoluminescence decay time dependences on excitation intensities. Low-temperature carrier lifetimes were found to be below one hundred picoseconds for the aligned quantum dots and to be determined by non-radiative recombination processes. Samples with different barrier thicknesses between the InGaAs and the quantum dot layer allow the discussion of possible influences of carrier traps at InGaAs/GaAs interface and in the dot layer.
Original language | English (US) |
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Title of host publication | Physica Status Solidi C: Conferences |
Pages | 1213-1216 |
Number of pages | 4 |
Edition | 4 |
DOIs | |
State | Published - 2003 |
Event | 2nd International Conference on Semiconductor Quantum Dots, QD 2002 - Tokyo, Japan Duration: Sep 30 2002 → Oct 3 2002 |
Other
Other | 2nd International Conference on Semiconductor Quantum Dots, QD 2002 |
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Country/Territory | Japan |
City | Tokyo |
Period | 9/30/02 → 10/3/02 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
- Materials Chemistry