Abstract
Data and analysis are presented employing several new methods to address carrier dynamics and photon management issues in order to improve internal quantum efficiency and light-extraction efficiency of GaN-based light-emitting diodes. For the carrier dynamics, studied are the effects of a newly-developed InAlN electron blocking layer and a p-InGaN:Mg layer on electron blocking and hole transport through multiple-quantum well active region. Also, a new technique of direct surface patterning is demonstrated using three-beam interference laser ablation for efficient photon management.
Original language | English (US) |
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Title of host publication | ECS Transactions |
Publisher | Electrochemical Society Inc. |
Pages | 109-116 |
Number of pages | 8 |
Volume | 61 |
Edition | 4 |
DOIs | |
State | Published - 2014 |
Event | Symposium on Wide Bandgap Semiconductor Materials and Devices 15 - 225th ECS Meeting - Orlando, United States Duration: May 11 2014 → May 15 2014 |
Other
Other | Symposium on Wide Bandgap Semiconductor Materials and Devices 15 - 225th ECS Meeting |
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Country/Territory | United States |
City | Orlando |
Period | 5/11/14 → 5/15/14 |
ASJC Scopus subject areas
- Engineering(all)