Carbon nanotube electrostatic biprism: Principle of operation and proof of concept

John Cumings, A. Zettl, Martha McCartney

Research output: Contribution to journalArticle

8 Scopus citations


During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

Original languageEnglish (US)
Pages (from-to)420-424
Number of pages5
JournalMicroscopy and Microanalysis
Issue number4
StatePublished - Aug 1 2004



  • Biprism
  • Carbon nanotube
  • Electron holography
  • Electrostatic biprism
  • Field emission
  • Holography
  • Nanotube

ASJC Scopus subject areas

  • Instrumentation

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