Carbon nanotube electrostatic biprism: Principle of operation and proof of concept

John Cumings, A. Zettl, Martha McCartney

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

Original languageEnglish (US)
Pages (from-to)420-424
Number of pages5
JournalMicroscopy and Microanalysis
Volume10
Issue number4
DOIs
StatePublished - Aug 2004

Fingerprint

Electrostatics
Carbon nanotubes
carbon nanotubes
electrostatics
Transmission electron microscopy
transmission electron microscopy
electron capture
Field emission
Nanotubes
field emission
Electron beams
nanotubes
electron beams
Imaging techniques
Electrons
Experiments

Keywords

  • Biprism
  • Carbon nanotube
  • Electron holography
  • Electrostatic biprism
  • Field emission
  • Holography
  • Nanotube

ASJC Scopus subject areas

  • Instrumentation

Cite this

Carbon nanotube electrostatic biprism : Principle of operation and proof of concept. / Cumings, John; Zettl, A.; McCartney, Martha.

In: Microscopy and Microanalysis, Vol. 10, No. 4, 08.2004, p. 420-424.

Research output: Contribution to journalArticle

@article{78da34a7de0940148ed1336d7d881b84,
title = "Carbon nanotube electrostatic biprism: Principle of operation and proof of concept",
abstract = "During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.",
keywords = "Biprism, Carbon nanotube, Electron holography, Electrostatic biprism, Field emission, Holography, Nanotube",
author = "John Cumings and A. Zettl and Martha McCartney",
year = "2004",
month = "8",
doi = "10.1017/S1431927604040759",
language = "English (US)",
volume = "10",
pages = "420--424",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "4",

}

TY - JOUR

T1 - Carbon nanotube electrostatic biprism

T2 - Principle of operation and proof of concept

AU - Cumings, John

AU - Zettl, A.

AU - McCartney, Martha

PY - 2004/8

Y1 - 2004/8

N2 - During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

AB - During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

KW - Biprism

KW - Carbon nanotube

KW - Electron holography

KW - Electrostatic biprism

KW - Field emission

KW - Holography

KW - Nanotube

UR - http://www.scopus.com/inward/record.url?scp=4444366462&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4444366462&partnerID=8YFLogxK

U2 - 10.1017/S1431927604040759

DO - 10.1017/S1431927604040759

M3 - Article

C2 - 15327702

AN - SCOPUS:4444366462

VL - 10

SP - 420

EP - 424

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 4

ER -