Carbon nanotube electrostatic biprism: Principle of operation and proof of concept

John Cumings; A. Zettl; Martha McCartney

doi:10.1017/S1431927604040759

Carbon nanotube electrostatic biprism: Principle of operation and proof of concept

John Cumings, A. Zettl, Martha McCartney

Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

Original language	English (US)
Pages (from-to)	420-424
Number of pages	5
Journal	Microscopy and Microanalysis
Volume	10
Issue number	4
DOIs	https://doi.org/10.1017/S1431927604040759
State	Published - Aug 2004

Keywords

Biprism
Carbon nanotube
Electron holography
Electrostatic biprism
Field emission
Holography
Nanotube

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1017/S1431927604040759

Cite this

@article{78da34a7de0940148ed1336d7d881b84,

title = "Carbon nanotube electrostatic biprism: Principle of operation and proof of concept",

abstract = "During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.",

keywords = "Biprism, Carbon nanotube, Electron holography, Electrostatic biprism, Field emission, Holography, Nanotube",

author = "John Cumings and A. Zettl and Martha McCartney",

year = "2004",

month = aug,

doi = "10.1017/S1431927604040759",

language = "English (US)",

volume = "10",

pages = "420--424",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "4",

}

TY - JOUR

T1 - Carbon nanotube electrostatic biprism

T2 - Principle of operation and proof of concept

AU - Cumings, John

AU - Zettl, A.

AU - McCartney, Martha

PY - 2004/8

Y1 - 2004/8

N2 - During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

AB - During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

KW - Biprism

KW - Carbon nanotube

KW - Electron holography

KW - Electrostatic biprism

KW - Field emission

KW - Holography

KW - Nanotube

UR - http://www.scopus.com/inward/record.url?scp=4444366462&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4444366462&partnerID=8YFLogxK

U2 - 10.1017/S1431927604040759

DO - 10.1017/S1431927604040759

M3 - Article

C2 - 15327702

AN - SCOPUS:4444366462

SN - 1431-9276

VL - 10

SP - 420

EP - 424

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 4

ER -

Carbon nanotube electrostatic biprism: Principle of operation and proof of concept

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this