Calculations of limited coherence for high resolution electron microscopy

Lan-Yun Chang, R. R. Meyer, A. I. Kirkland

Research output: Contribution to journalConference article

Abstract

Improvements in instrumentation through the use of monochromators and field emission electron sources suggest that the ways in which the limited coherence effects are calculated must be re-examined. In this paper the effects of these approximations on the accuracy of the resultant image intensity are investigated as a function of both defocus and beam divergence.

Original languageEnglish (US)
Pages (from-to)345-348
Number of pages4
JournalInstitute of Physics Conference Series
Volume179
StatePublished - Oct 19 2004
Externally publishedYes
EventElectron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom
Duration: Sep 3 2003Sep 5 2003

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electron microscopy
electron sources
high resolution
monochromators
field emission
divergence
approximation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Calculations of limited coherence for high resolution electron microscopy. / Chang, Lan-Yun; Meyer, R. R.; Kirkland, A. I.

In: Institute of Physics Conference Series, Vol. 179, 19.10.2004, p. 345-348.

Research output: Contribution to journalConference article

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