Calculations of limited coherence for high resolution electron microscopy

L. Y. Chang, R. R. Meyer, A. I. Kirkland

Research output: Contribution to journalConference articlepeer-review

Abstract

Improvements in instrumentation through the use of monochromators and field emission electron sources suggest that the ways in which the limited coherence effects are calculated must be re-examined. In this paper the effects of these approximations on the accuracy of the resultant image intensity are investigated as a function of both defocus and beam divergence.

Original languageEnglish (US)
Pages (from-to)345-348
Number of pages4
JournalInstitute of Physics Conference Series
Volume179
StatePublished - Oct 19 2004
Externally publishedYes
EventElectron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom
Duration: Sep 3 2003Sep 5 2003

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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