Built-in-self test of transmitter I/Q mismatch using self-mixing envelope detector

Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as power or envelope detectors or small additional circuitry can be used for BiST purposes. However, due to limited bandwidth, measurement of complex specifications, such as IQ imbalance is challenging. Since these parameters are most amenable for digital compensation, their characterization and monitoring are desirable. In this paper, we propose a BiST technique for transmitter IQ imbalance using a self-mixing envelope detector. We first derive an analytical expression for the output signal. Using this expression, we devise test signals to isolate the effects of gain and phase imbalance, DC offsets, and time skews from other parameters of the system. Once isolated, these parameters are calculated easily with a few mathematical operations. Simulations and hardware measurements show that the technique can provide accurate characterization of IQ imbalances.

Original languageEnglish (US)
Title of host publicationProceedings - 2012 30th IEEE VLSI Test Symposium, VTS 2012
Pages56-61
Number of pages6
DOIs
StatePublished - Aug 20 2012
Event2012 30th IEEE VLSI Test Symposium, VTS 2012 - Hyatt Maui, HI, United States
Duration: Apr 23 2012Apr 26 2012

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Other

Other2012 30th IEEE VLSI Test Symposium, VTS 2012
CountryUnited States
CityHyatt Maui, HI
Period4/23/124/26/12

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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