Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited)

Alberto Valdes-Garcia; Waleed Khalil; Bertan Bakkaloglu; Jose Silva-Martinez; Edgar Sanchez-Sinencio

doi:10.1109/RFIC.2007.380895

Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited)

Alberto Valdes-Garcia, Waleed Khalil, Bertan Bakkaloglu, Jose Silva-Martinez, Edgar Sanchez-Sinencio

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

27 Scopus citations

Abstract

Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.

Original language	English (US)
Title of host publication	Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
Pages	335-338
Number of pages	4
DOIs	https://doi.org/10.1109/RFIC.2007.380895
State	Published - Oct 2 2007
Event	2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 - Honolulu, HI, United States Duration: Jun 3 2007 → Jun 5 2007

Publication series

Name	Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)	1529-2517

Other

Other	2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
Country	United States
City	Honolulu, HI
Period	6/3/07 → 6/5/07

Keywords

Amplitude detector
Built-in self test
Loopback
RF test
VCO phase noise
Wireless transceiver

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/RFIC.2007.380895

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Valdes-Garcia, A., Khalil, W., Bakkaloglu, B., Silva-Martinez, J., & Sanchez-Sinencio, E. (2007). Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited). In Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 (pp. 335-338). [4266443] (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2007.380895

Built-in self test of RF transceiver SoCs : From signal chain to RF synthesizers (invited). / Valdes-Garcia, Alberto; Khalil, Waleed; Bakkaloglu, Bertan; Silva-Martinez, Jose; Sanchez-Sinencio, Edgar.

Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007. 2007. p. 335-338 4266443 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Valdes-Garcia, A, Khalil, W, Bakkaloglu, B, Silva-Martinez, J & Sanchez-Sinencio, E 2007, Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited). in Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007., 4266443, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, pp. 335-338, 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007, Honolulu, HI, United States, 6/3/07. https://doi.org/10.1109/RFIC.2007.380895

Valdes-Garcia A, Khalil W, Bakkaloglu B, Silva-Martinez J, Sanchez-Sinencio E. Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited). In Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007. 2007. p. 335-338. 4266443. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2007.380895

Valdes-Garcia, Alberto ; Khalil, Waleed ; Bakkaloglu, Bertan ; Silva-Martinez, Jose ; Sanchez-Sinencio, Edgar. / Built-in self test of RF transceiver SoCs : From signal chain to RF synthesizers (invited). Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007. 2007. pp. 335-338 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

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