TY - GEN
T1 - Built-in self test of RF transceiver SoCs
T2 - 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
AU - Valdes-Garcia, Alberto
AU - Khalil, Waleed
AU - Bakkaloglu, Bertan
AU - Silva-Martinez, Jose
AU - Sanchez-Sinencio, Edgar
PY - 2007/10/2
Y1 - 2007/10/2
N2 - Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
AB - Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
KW - Amplitude detector
KW - Built-in self test
KW - Loopback
KW - RF test
KW - VCO phase noise
KW - Wireless transceiver
UR - http://www.scopus.com/inward/record.url?scp=34748900562&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34748900562&partnerID=8YFLogxK
U2 - 10.1109/RFIC.2007.380895
DO - 10.1109/RFIC.2007.380895
M3 - Conference contribution
AN - SCOPUS:34748900562
SN - 1424405319
SN - 9781424405312
T3 - Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
SP - 335
EP - 338
BT - Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
Y2 - 3 June 2007 through 5 June 2007
ER -