Abstract
Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
| Original language | English (US) |
|---|---|
| Title of host publication | Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium |
| Pages | 335-338 |
| Number of pages | 4 |
| DOIs | |
| State | Published - 2007 |
| Event | 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 - Honolulu, HI, United States Duration: Jun 3 2007 → Jun 5 2007 |
Other
| Other | 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 |
|---|---|
| Country | United States |
| City | Honolulu, HI |
| Period | 6/3/07 → 6/5/07 |
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Keywords
- Amplitude detector
- Built-in self test
- Loopback
- RF test
- VCO phase noise
- Wireless transceiver
ASJC Scopus subject areas
- Engineering(all)
Cite this
Built-in self test of RF transceiver SoCs : From signal chain to RF synthesizers (invited). / Valdes-Garcia, Alberto; Khalil, Waleed; Bakkaloglu, Bertan; Silva-Martinez, Jose; Sanchez-Sinencio, Edgar.
Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2007. p. 335-338 4266443.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Built-in self test of RF transceiver SoCs
T2 - From signal chain to RF synthesizers (invited)
AU - Valdes-Garcia, Alberto
AU - Khalil, Waleed
AU - Bakkaloglu, Bertan
AU - Silva-Martinez, Jose
AU - Sanchez-Sinencio, Edgar
PY - 2007
Y1 - 2007
N2 - Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
AB - Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
KW - Amplitude detector
KW - Built-in self test
KW - Loopback
KW - RF test
KW - VCO phase noise
KW - Wireless transceiver
UR - http://www.scopus.com/inward/record.url?scp=34748900562&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34748900562&partnerID=8YFLogxK
U2 - 10.1109/RFIC.2007.380895
DO - 10.1109/RFIC.2007.380895
M3 - Conference contribution
AN - SCOPUS:34748900562
SN - 1424405319
SN - 9781424405312
SP - 335
EP - 338
BT - Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ER -