Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited)

Alberto Valdes-Garcia, Waleed Khalil, Bertan Bakkaloglu, Jose Silva-Martinez, Edgar Sanchez-Sinencio

Research output: Chapter in Book/Report/Conference proceedingConference contribution

27 Citations (Scopus)

Abstract

Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.

Original languageEnglish (US)
Title of host publicationDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
Pages335-338
Number of pages4
DOIs
StatePublished - 2007
Event2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 - Honolulu, HI, United States
Duration: Jun 3 2007Jun 5 2007

Other

Other2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
CountryUnited States
CityHonolulu, HI
Period6/3/076/5/07

Fingerprint

Built-in self test
Discriminators
Phase noise
Transceivers
Failure analysis
Detectors
Silicon
Networks (circuits)

Keywords

  • Amplitude detector
  • Built-in self test
  • Loopback
  • RF test
  • VCO phase noise
  • Wireless transceiver

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Valdes-Garcia, A., Khalil, W., Bakkaloglu, B., Silva-Martinez, J., & Sanchez-Sinencio, E. (2007). Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited). In Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium (pp. 335-338). [4266443] https://doi.org/10.1109/RFIC.2007.380895

Built-in self test of RF transceiver SoCs : From signal chain to RF synthesizers (invited). / Valdes-Garcia, Alberto; Khalil, Waleed; Bakkaloglu, Bertan; Silva-Martinez, Jose; Sanchez-Sinencio, Edgar.

Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2007. p. 335-338 4266443.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Valdes-Garcia, A, Khalil, W, Bakkaloglu, B, Silva-Martinez, J & Sanchez-Sinencio, E 2007, Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited). in Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium., 4266443, pp. 335-338, 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007, Honolulu, HI, United States, 6/3/07. https://doi.org/10.1109/RFIC.2007.380895
Valdes-Garcia A, Khalil W, Bakkaloglu B, Silva-Martinez J, Sanchez-Sinencio E. Built-in self test of RF transceiver SoCs: From signal chain to RF synthesizers (invited). In Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2007. p. 335-338. 4266443 https://doi.org/10.1109/RFIC.2007.380895
Valdes-Garcia, Alberto ; Khalil, Waleed ; Bakkaloglu, Bertan ; Silva-Martinez, Jose ; Sanchez-Sinencio, Edgar. / Built-in self test of RF transceiver SoCs : From signal chain to RF synthesizers (invited). Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2007. pp. 335-338
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