TY - GEN
T1 - Built-in self-test and characterization of polar transmitter parameters in the loop-back mode
AU - Jeong, Jae Woong
AU - Ozev, Sule
AU - Sen, Shreyas
AU - Natarajan, Vishwanath
AU - Slamani, Mustapha
PY - 2014/1/1
Y1 - 2014/1/1
N2 - This paper presents a Built-in self-test (BIST) solution for polar transmitters with low cost. Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, they generally require iterative test/measurement/calibration cycles. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Typically, these parameters are not directly measured but calibrated through spectral performance analysis using expensive RF equipment, leading to lengthy and costly measurement/calibration cycles. Characterization and calibration of these parameters inside the device would reduce the test time and cost considerably. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth, two parameters that can be digitally calibrated, based on the measurement of the output of the receiver in the loop-back mode. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately.
AB - This paper presents a Built-in self-test (BIST) solution for polar transmitters with low cost. Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, they generally require iterative test/measurement/calibration cycles. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Typically, these parameters are not directly measured but calibrated through spectral performance analysis using expensive RF equipment, leading to lengthy and costly measurement/calibration cycles. Characterization and calibration of these parameters inside the device would reduce the test time and cost considerably. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth, two parameters that can be digitally calibrated, based on the measurement of the output of the receiver in the loop-back mode. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately.
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U2 - 10.7873/DATE2014.382
DO - 10.7873/DATE2014.382
M3 - Conference contribution
AN - SCOPUS:84903833928
SN - 9783981537024
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - Proceedings - Design, Automation and Test in Europe, DATE 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th Design, Automation and Test in Europe, DATE 2014
Y2 - 24 March 2014 through 28 March 2014
ER -