Built-in self-test and characterization of polar transmitter parameters in the loop-back mode

Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper presents a Built-in self-test (BIST) solution for polar transmitters with low cost. Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, they generally require iterative test/measurement/calibration cycles. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Typically, these parameters are not directly measured but calibrated through spectral performance analysis using expensive RF equipment, leading to lengthy and costly measurement/calibration cycles. Characterization and calibration of these parameters inside the device would reduce the test time and cost considerably. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth, two parameters that can be digitally calibrated, based on the measurement of the output of the receiver in the loop-back mode. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately.

Original languageEnglish (US)
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9783981537024
DOIs
StatePublished - 2014
Event17th Design, Automation and Test in Europe, DATE 2014 - Dresden, Germany
Duration: Mar 24 2014Mar 28 2014

Other

Other17th Design, Automation and Test in Europe, DATE 2014
CountryGermany
CityDresden
Period3/24/143/28/14

Fingerprint

Built-in self test
Transmitters
Calibration
Bandwidth
Intermodulation distortion
Costs
Masks
Hardware

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Jeong, J. W., Ozev, S., Sen, S., Natarajan, V., & Slamani, M. (2014). Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. In Proceedings -Design, Automation and Test in Europe, DATE [6800583] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.7873/DATE2014.382

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. / Jeong, Jae Woong; Ozev, Sule; Sen, Shreyas; Natarajan, Vishwanath; Slamani, Mustapha.

Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc., 2014. 6800583.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jeong, JW, Ozev, S, Sen, S, Natarajan, V & Slamani, M 2014, Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. in Proceedings -Design, Automation and Test in Europe, DATE., 6800583, Institute of Electrical and Electronics Engineers Inc., 17th Design, Automation and Test in Europe, DATE 2014, Dresden, Germany, 3/24/14. https://doi.org/10.7873/DATE2014.382
Jeong JW, Ozev S, Sen S, Natarajan V, Slamani M. Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. In Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc. 2014. 6800583 https://doi.org/10.7873/DATE2014.382
Jeong, Jae Woong ; Ozev, Sule ; Sen, Shreyas ; Natarajan, Vishwanath ; Slamani, Mustapha. / Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc., 2014.
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