Brightness measurements of nanometer-sized field-emission tips

M. R. Scheinfein, W. Qian, John Spence

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Brightness of electron field emitters is defined as the current density per unit solid angle. It is of interest that the measurement of average brightness of a tungsten nanotip field emitter be reported in this paper. It is believed that brightness of electron field emitters of atomic dimensions may exceed that of conventional field emission sources.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages632-633
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

Fingerprint

Field emission
Luminance
Nanotips
Electrons
Tungsten
Current density

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Scheinfein, M. R., Qian, W., & Spence, J. (1993). Brightness measurements of nanometer-sized field-emission tips. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 632-633). Publ by San Francisco Press Inc.

Brightness measurements of nanometer-sized field-emission tips. / Scheinfein, M. R.; Qian, W.; Spence, John.

Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. p. 632-633.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scheinfein, MR, Qian, W & Spence, J 1993, Brightness measurements of nanometer-sized field-emission tips. in Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, pp. 632-633, Proceedings of the 51st Annual Meeting Microscopy Society of America, Cincinnati, OH, USA, 8/1/93.
Scheinfein MR, Qian W, Spence J. Brightness measurements of nanometer-sized field-emission tips. In Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc. 1993. p. 632-633
Scheinfein, M. R. ; Qian, W. ; Spence, John. / Brightness measurements of nanometer-sized field-emission tips. Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. pp. 632-633
@inproceedings{793a0b28a2784d4cb9a1c43a736c0972,
title = "Brightness measurements of nanometer-sized field-emission tips",
abstract = "Brightness of electron field emitters is defined as the current density per unit solid angle. It is of interest that the measurement of average brightness of a tungsten nanotip field emitter be reported in this paper. It is believed that brightness of electron field emitters of atomic dimensions may exceed that of conventional field emission sources.",
author = "Scheinfein, {M. R.} and W. Qian and John Spence",
year = "1993",
language = "English (US)",
pages = "632--633",
booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",
publisher = "Publ by San Francisco Press Inc",

}

TY - GEN

T1 - Brightness measurements of nanometer-sized field-emission tips

AU - Scheinfein, M. R.

AU - Qian, W.

AU - Spence, John

PY - 1993

Y1 - 1993

N2 - Brightness of electron field emitters is defined as the current density per unit solid angle. It is of interest that the measurement of average brightness of a tungsten nanotip field emitter be reported in this paper. It is believed that brightness of electron field emitters of atomic dimensions may exceed that of conventional field emission sources.

AB - Brightness of electron field emitters is defined as the current density per unit solid angle. It is of interest that the measurement of average brightness of a tungsten nanotip field emitter be reported in this paper. It is believed that brightness of electron field emitters of atomic dimensions may exceed that of conventional field emission sources.

UR - http://www.scopus.com/inward/record.url?scp=0027707148&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027707148&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027707148

SP - 632

EP - 633

BT - Proceedings - Annual Meeting, Microscopy Society of America

PB - Publ by San Francisco Press Inc

ER -