Brightness measurements of nanometer-sized field-emission-electron sources

W. Qian; M. R. Scheinfein; John Spence

doi:10.1063/1.352371

Brightness measurements of nanometer-sized field-emission-electron sources

W. Qian, M. R. Scheinfein, John Spence

Physics

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45 Scopus citations

Abstract

The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×10⁸ A cm^-2 sr ^-1 at 470 V, or 7.7×10¹⁰ A cm^-2 sr ^-1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

Original language	English (US)
Pages (from-to)	7041-7045
Number of pages	5
Journal	Journal of Applied Physics
Volume	73
Issue number	11
DOIs	https://doi.org/10.1063/1.352371
State	Published - Dec 1 1993

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Brightness measurements of nanometer-sized field-emission-electron sources",

abstract = "The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.",

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T1 - Brightness measurements of nanometer-sized field-emission-electron sources

AU - Qian, W.

AU - Scheinfein, M. R.

AU - Spence, John

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N2 - The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

AB - The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

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Brightness measurements of nanometer-sized field-emission-electron sources

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