Brightness measurements of nanometer-sized field-emission-electron sources

W. Qian; M. R. Scheinfein; John Spence

doi:10.1063/1.352371

Brightness measurements of nanometer-sized field-emission-electron sources

W. Qian, M. R. Scheinfein, John Spence

Physics

Research output: Contribution to journal › Article › peer-review

58 Scopus citations

Abstract

The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×10⁸ A cm^-2 sr ^-1 at 470 V, or 7.7×10¹⁰ A cm^-2 sr ^-1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

Original language	English (US)
Pages (from-to)	7041-7045
Number of pages	5
Journal	Journal of Applied Physics
Volume	73
Issue number	11
DOIs	https://doi.org/10.1063/1.352371
State	Published - 1993

ASJC Scopus subject areas

General Physics and Astronomy

Access to Document

10.1063/1.352371

Cite this

@article{e6f0ba0af06d41abaca737143c1384ee,

title = "Brightness measurements of nanometer-sized field-emission-electron sources",

abstract = "The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.",

author = "W. Qian and Scheinfein, {M. R.} and John Spence",

year = "1993",

doi = "10.1063/1.352371",

language = "English (US)",

volume = "73",

pages = "7041--7045",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "11",

}

TY - JOUR

T1 - Brightness measurements of nanometer-sized field-emission-electron sources

AU - Qian, W.

AU - Scheinfein, M. R.

AU - Spence, John

PY - 1993

Y1 - 1993

N2 - The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

AB - The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

UR - http://www.scopus.com/inward/record.url?scp=0000084834&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000084834&partnerID=8YFLogxK

U2 - 10.1063/1.352371

DO - 10.1063/1.352371

M3 - Article

AN - SCOPUS:0000084834

SN - 0021-8979

VL - 73

SP - 7041

EP - 7045

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

ER -

Brightness measurements of nanometer-sized field-emission-electron sources

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this