Brightness measurements of nanometer-sized field-emission-electron sources

W. Qian, M. R. Scheinfein, John Spence

Research output: Contribution to journalArticlepeer-review

56 Scopus citations

Abstract

The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm-2 sr -1 at 470 V, or 7.7×1010 A cm-2 sr -1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/ undulator devices.

Original languageEnglish (US)
Pages (from-to)7041-7045
Number of pages5
JournalJournal of Applied Physics
Volume73
Issue number11
DOIs
StatePublished - Dec 1 1993

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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