Bright-field imaging of compound semiconductors using aberration-corrected scanning transmission electron microscopy

Engineering & Materials Science

• Aberrations 100%
• Transmission electron microscopy 77%
• Semiconductor materials 67%
• Scanning electron microscopy 59%
• Imaging techniques 58%
• Atoms 52%
• Heterojunctions 32%
• Crystals 25%
• Electron microscopes 23%
• Scanning 19%

Physics & Astronomy

• aberration 67%
• transmission electron microscopy 49%
• scanning electron microscopy 49%
• zincblende 23%
• image contrast 21%
• phase contrast 21%
• atoms 19%
• polarity 17%
• projection 15%
• electron microscopes 15%
• scanning 11%
• crystals 9%

Chemical Compounds

• Scanning Transmission Electron Microscopy 86%
• Semiconductor 57%
• Column Like Crystal 45%
• Polarity 30%
• Electron Particle 20%