Bit error rates from sample testing surface areas of optical media

George Runger; Patrick D. Spagon

doi:10.1080/08982119708919056

Bit error rates from sample testing surface areas of optical media

IAFSE-SCAI: Industrial, Systems and Operations Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	363-366
Number of pages	4
Journal	Quality Engineering
Volume	9
Issue number	3
DOIs	https://doi.org/10.1080/08982119708919056
State	Published - 1997

Keywords

Poisson distribution
Standard error
Stochastic geometry

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Industrial and Manufacturing Engineering

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10.1080/08982119708919056

Cite this

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title = "Bit error rates from sample testing surface areas of optical media",

keywords = "Poisson distribution, Standard error, Stochastic geometry",

author = "George Runger and Spagon, {Patrick D.}",

year = "1997",

doi = "10.1080/08982119708919056",

language = "English (US)",

volume = "9",

pages = "363--366",

journal = "Quality Engineering",

issn = "0898-2112",

publisher = "Taylor and Francis Ltd.",

number = "3",

}

TY - JOUR

T1 - Bit error rates from sample testing surface areas of optical media

AU - Runger, George

AU - Spagon, Patrick D.

PY - 1997

Y1 - 1997

KW - Poisson distribution

KW - Standard error

KW - Stochastic geometry

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DO - 10.1080/08982119708919056

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EP - 366

JO - Quality Engineering

JF - Quality Engineering

SN - 0898-2112

IS - 3

ER -

Bit error rates from sample testing surface areas of optical media

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this