Binary tree SVM based framework for mining fatigue induced damage attributes in complex lug joints

Clyde K. Coelho, Santanu Das, Aditi Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Research is being conducted in damage diagnosis and prognosis to develop state awareness models and residual useful life estimates of aerospace structures. This work describes a methodology using Support Vector Machines (SVMs), organized in a binary tree structure to classify the extent of a growing crack in lug joints. A lug joint is a common aerospace 'hotspot' where fatigue damage is highly probable. The test specimen was instrumented with surface mounted piezoelectric transducers and then subjected to fatigue load until failure. A Matching Pursuit Decomposition (MPD) algorithm was used to preprocess the sensor data and extract the input vectors used in classification. The results of this classification scheme show that this type of architecture works well for categorizing fatigue induced damage (crack) in a computationally efficient manner. However, due to the nature of the overlap of the collected data patterns, a classifier at each node in the binary tree is limited by the performance of the classifier that is higher up in the tree.

Original languageEnglish (US)
Title of host publicationModeling, Signal Processing, and Control for Smart Structures 2008
DOIs
StatePublished - Jun 2 2008
EventModeling, Signal Processing, and Control for Smart Structures 2008 - San Diego, CA, United States
Duration: Mar 10 2008Mar 12 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6926
ISSN (Print)0277-786X

Other

OtherModeling, Signal Processing, and Control for Smart Structures 2008
CountryUnited States
CitySan Diego, CA
Period3/10/083/12/08

Keywords

  • Binary tree
  • Damage classification
  • Matching pursuit decomposition
  • Structural health monitoring
  • Support vector machines

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Coelho, C. K., Das, S., & Chattopadhyay, A. (2008). Binary tree SVM based framework for mining fatigue induced damage attributes in complex lug joints. In Modeling, Signal Processing, and Control for Smart Structures 2008 [69260Q] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6926). https://doi.org/10.1117/12.776481