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Bias temperature instability model using dynamic defect potential for predicting CMOS aging
Runchen Fang, Ian Livingston, Ivan Sanchez Esqueda, Michael Kozicki, Hugh Barnaby
- Solid State Electronics Research Center (CSSER)
- Materials Science and Engineering
- Electrical Engineering
- Nano-Electronics, Arizona Institute of (AINE)
- Applied Nanoionics, Center for (CANi)
- Embedded Systems, Consortium for (CES)
- Adaptive Neural Systems, Center for (ANS)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Knowledge Enterprise (KE)
- Connection One (C1)
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations