Beyond small-angle x-ray scattering: Exploiting angular correlations

D. K. Saldin, H. C. Poon, V. L. Shneerson, M. Howells, H. N. Chapman, Richard Kirian, Kevin Schmidt, John Spence

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

We propose a method for determining the projected electron density of an individual molecule from diffraction patterns of many such simultaneously illuminated molecules, randomly oriented about an axis parallel to an incident x-ray beam. We illustrate the idea with a simulation of a structure determination of a K-channel membrane protein in situ.

Original languageEnglish (US)
Article number174105
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume81
Issue number17
DOIs
StatePublished - May 7 2010

Fingerprint

x ray scattering
angular correlation
Scattering
X rays
Molecules
Diffraction patterns
Carrier concentration
molecules
Membrane Proteins
diffraction patterns
membranes
proteins
Proteins
Membranes
x rays
simulation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Beyond small-angle x-ray scattering : Exploiting angular correlations. / Saldin, D. K.; Poon, H. C.; Shneerson, V. L.; Howells, M.; Chapman, H. N.; Kirian, Richard; Schmidt, Kevin; Spence, John.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 81, No. 17, 174105, 07.05.2010.

Research output: Contribution to journalArticle

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