Abstract
Analysis of metal-organic framework (MOF) structure by electron microscopy and electron diffraction offers an alternative to growing large single crystals for high-resolution X-ray diffraction. However, many MOFs are electron beam-sensitive, which can make structural analysis using high-resolution electron microscopy difficult. In this work we use the microcrystal electron diffraction (MicroED) method to collect high-resolution electron diffraction data from a model beam-sensitive MOF, ZIF-8. The diffraction data could be used to determine the structure of ZIF-8 to 0.87 Å from a single ZIF-8 nanocrystal, and this refined structure compares well with previously published structures of ZIF-8 determined by X-ray crystallography. This demonstrates that MicroED can be a valuable tool for the analysis of beam-sensitive MOF structures directly from nano and microcrystalline material.
Original language | English (US) |
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Article number | 113048 |
Journal | Ultramicroscopy |
Volume | 216 |
DOIs | |
State | Published - Sep 2020 |
Keywords
- CryoEM
- Crystallography
- Electron diffraction
- Metal-organic framework
- MicroED
- Microcrystal electron diffraction
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation
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CCDC 1997958: Experimental Crystal Structure Determination
Banihashemi, F. (Contributor), Bu, G. (Contributor), Thaker, A. (Contributor), Williams, D. (Contributor), Lin, J. (Contributor) & Nannenga, B. (Contributor), The Cambridge Structural Database, 2020
DOI: 10.5517/ccdc.csd.cc25218l, http://www.ccdc.cam.ac.uk/services/structure_request?id=doi:10.5517/ccdc.csd.cc25218l&sid=DataCite
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