TY - GEN
T1 - Bayesian network for reliability prediction in functional design stage
AU - Yontay, Petek
AU - Sanchez, Luis Mejia
AU - Pan, Rong
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/8
Y1 - 2015/5/8
N2 - Due to the lack of reliability data at a product's very early design stage, the reliability prediction in this phase is often problematic. In order to tackle this problem, one needs to utilize auxiliary information such as the reliability information from similar products and domain expertise. In this article, we propose a Bayesian network approach to incorporate data from functional analysis and parent products. We apply our method on a case study to demonstrate our proposed method. In the case study, we identify the functions with low reliability and their impact on other functions in the network, thus design changes can be suggested for system reliability improvement.
AB - Due to the lack of reliability data at a product's very early design stage, the reliability prediction in this phase is often problematic. In order to tackle this problem, one needs to utilize auxiliary information such as the reliability information from similar products and domain expertise. In this article, we propose a Bayesian network approach to incorporate data from functional analysis and parent products. We apply our method on a case study to demonstrate our proposed method. In the case study, we identify the functions with low reliability and their impact on other functions in the network, thus design changes can be suggested for system reliability improvement.
KW - Bayesian network
KW - conceptual design
KW - early reliability assessment
KW - functional analysis
UR - http://www.scopus.com/inward/record.url?scp=84945406388&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84945406388&partnerID=8YFLogxK
U2 - 10.1109/RAMS.2015.7105117
DO - 10.1109/RAMS.2015.7105117
M3 - Conference contribution
AN - SCOPUS:84945406388
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - RAMS 2015 - 61st Annual Reliability and Maintainability Symposium, Proceedings and Tutorials 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st Annual Reliability and Maintainability Symposium, RAMS 2015
Y2 - 26 January 2015 through 29 January 2015
ER -