Bayesian network for reliability prediction in functional design stage

Petek Yontay, Luis Mejia Sanchez, Rong Pan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Due to the lack of reliability data at a product's very early design stage, the reliability prediction in this phase is often problematic. In order to tackle this problem, one needs to utilize auxiliary information such as the reliability information from similar products and domain expertise. In this article, we propose a Bayesian network approach to incorporate data from functional analysis and parent products. We apply our method on a case study to demonstrate our proposed method. In the case study, we identify the functions with low reliability and their impact on other functions in the network, thus design changes can be suggested for system reliability improvement.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Reliability and Maintainability Symposium
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-May
ISBN (Print)9781479967025
DOIs
StatePublished - May 8 2015
Event61st Annual Reliability and Maintainability Symposium, RAMS 2015 - Palm Harbor, United States
Duration: Jan 26 2015Jan 29 2015

Other

Other61st Annual Reliability and Maintainability Symposium, RAMS 2015
CountryUnited States
CityPalm Harbor
Period1/26/151/29/15

Fingerprint

Bayesian networks
Bayesian Networks
Prediction
Auxiliary Information
Functional Analysis
System Reliability
Network Design
Expertise
Functional analysis
Design
Demonstrate

Keywords

  • Bayesian network
  • conceptual design
  • early reliability assessment
  • functional analysis

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Mathematics(all)
  • Computer Science Applications

Cite this

Yontay, P., Sanchez, L. M., & Pan, R. (2015). Bayesian network for reliability prediction in functional design stage. In Proceedings - Annual Reliability and Maintainability Symposium (Vol. 2015-May). [7105117] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RAMS.2015.7105117

Bayesian network for reliability prediction in functional design stage. / Yontay, Petek; Sanchez, Luis Mejia; Pan, Rong.

Proceedings - Annual Reliability and Maintainability Symposium. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015. 7105117.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yontay, P, Sanchez, LM & Pan, R 2015, Bayesian network for reliability prediction in functional design stage. in Proceedings - Annual Reliability and Maintainability Symposium. vol. 2015-May, 7105117, Institute of Electrical and Electronics Engineers Inc., 61st Annual Reliability and Maintainability Symposium, RAMS 2015, Palm Harbor, United States, 1/26/15. https://doi.org/10.1109/RAMS.2015.7105117
Yontay P, Sanchez LM, Pan R. Bayesian network for reliability prediction in functional design stage. In Proceedings - Annual Reliability and Maintainability Symposium. Vol. 2015-May. Institute of Electrical and Electronics Engineers Inc. 2015. 7105117 https://doi.org/10.1109/RAMS.2015.7105117
Yontay, Petek ; Sanchez, Luis Mejia ; Pan, Rong. / Bayesian network for reliability prediction in functional design stage. Proceedings - Annual Reliability and Maintainability Symposium. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015.
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