Bayesian inference model for step-stress accelerated life testing with type-II censoring

Jinsuk Lee, Rong Pan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

In this paper we present a Bayes inference model for a simple step-stress accelerated life test (SSALT) using type-II censored samples. We assume that the failure times at each stress are exponentially distributed with a mean that is a loglinear function of the natural stress level, and derive a likelihood function for the SSALT model under type-II censoring. We integrate the engineering knowledge into the prior distribution of the parameters in log-linear function, and through a Siegel-gamma distribution conjugation we can derive the posterior distribution for the parameters of interest. Applying Bayes approach to SSALT, the statistical precision of parameter inference is improved and the required number of samples is reduced.

Original languageEnglish (US)
Title of host publication2008 Proceedings - Annual Reliability and Maintainability Symposium, RAMS 2008
DOIs
StatePublished - Dec 1 2008
Event54th Annual Reliability and Maintainability Symposium, RAMS 2008 - Las Vegas, NV, United States
Duration: Jan 28 2008Jan 31 2008

Publication series

NameProceedings - Annual Reliability and Maintainability Symposium
ISSN (Print)0149-144X

Other

Other54th Annual Reliability and Maintainability Symposium, RAMS 2008
CountryUnited States
CityLas Vegas, NV
Period1/28/081/31/08

Keywords

  • Bayesian inference
  • Conjugate prior
  • Siegel-gamma distribution
  • Step-stress ALT
  • Type-II censoring

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Mathematics(all)
  • Computer Science Applications

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    Lee, J., & Pan, R. (2008). Bayesian inference model for step-stress accelerated life testing with type-II censoring. In 2008 Proceedings - Annual Reliability and Maintainability Symposium, RAMS 2008 [4925776] (Proceedings - Annual Reliability and Maintainability Symposium). https://doi.org/10.1109/RAMS.2008.4925776