Bauschinger effect in unpassivated freestanding nanoscale metal films

Jagannathan Rajagopalan, Jong H. Han, M. Taher A. Saif

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

We show experimentally that unpassivated freestanding nanoscale metal films, subjected to uniaxial tension, show substantial Bauschinger effect (BE) during unloading, even at large overall tensile stresses. Aluminum films (thickness 200-400 nm, grain size ≈200 nm) show BE at stresses as high as 150 MPa and their plastic strain after unloading is often less than 50% of the expected value. In gold, BE is relatively smaller. Possible mechanisms for BE in unpassivated thin metal films are discussed.

Original languageEnglish (US)
Pages (from-to)734-737
Number of pages4
JournalScripta Materialia
Volume59
Issue number7
DOIs
StatePublished - Oct 2008
Externally publishedYes

Fingerprint

Bauschinger effect
Unloading
metal films
Metals
unloading
Aluminum
Tensile stress
Gold
Film thickness
Plastic deformation
tensile stress
film thickness
plastics
grain size
gold
aluminum

Keywords

  • Bauschinger effect
  • Plastic deformation
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Metals and Alloys

Cite this

Bauschinger effect in unpassivated freestanding nanoscale metal films. / Rajagopalan, Jagannathan; Han, Jong H.; Saif, M. Taher A.

In: Scripta Materialia, Vol. 59, No. 7, 10.2008, p. 734-737.

Research output: Contribution to journalArticle

Rajagopalan, Jagannathan ; Han, Jong H. ; Saif, M. Taher A. / Bauschinger effect in unpassivated freestanding nanoscale metal films. In: Scripta Materialia. 2008 ; Vol. 59, No. 7. pp. 734-737.
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