Bandwidth analysis of phase crossover and non-phase crossover frequency operations of HAIS

Sivaseetharaman Pandi, Subramanian Ramalingam, Constantine Balanis, Craig R. Birtcher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Scalar Holographic Artificial Impedance Surface (HAIS) is a modulated slow leaky-wave antenna whose surface impedance profile is obtained using holographic principle. The surface impedance modulation functions aid in the formation of the desired radiation pattern, polarization, aperture efficiency and bandwidth of the radiating structure. This paper compares the bandwidth of phase crossover and non-phase crossover frequency operations of scalar HAIS. It is shown that the non-phase crossover frequency operation provides an additional degree of freedom of structural modification to achieve desired polarization along with larger operational bandwidth.

Original languageEnglish (US)
Title of host publication2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages287-288
Number of pages2
Volume2017-January
ISBN (Electronic)9781538632840
DOIs
Publication statusPublished - Oct 18 2017
Event2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017 - San Diego, United States
Duration: Jul 9 2017Jul 14 2017

Other

Other2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017
CountryUnited States
CitySan Diego
Period7/9/177/14/17

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ASJC Scopus subject areas

  • Radiation
  • Computer Networks and Communications
  • Instrumentation

Cite this

Pandi, S., Ramalingam, S., Balanis, C., & Birtcher, C. R. (2017). Bandwidth analysis of phase crossover and non-phase crossover frequency operations of HAIS. In 2017 IEEE Antennas and Propagation Society International Symposium, Proceedings (Vol. 2017-January, pp. 287-288). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APUSNCURSINRSM.2017.8072186