Background intensity problems in high resolution defect imaging

A. Howie, N. Jiang, John Spence, J. Wu

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)900-901
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

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Imaging techniques
Defects
high resolution
defects

ASJC Scopus subject areas

  • Instrumentation

Cite this

Background intensity problems in high resolution defect imaging. / Howie, A.; Jiang, N.; Spence, John; Wu, J.

In: Microscopy and Microanalysis, Vol. 12, No. SUPPL. 2, 08.2006, p. 900-901.

Research output: Contribution to journalArticle

Howie, A. ; Jiang, N. ; Spence, John ; Wu, J. / Background intensity problems in high resolution defect imaging. In: Microscopy and Microanalysis. 2006 ; Vol. 12, No. SUPPL. 2. pp. 900-901.
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