Background intensity problems in high resolution defect imaging

A. Howie; N. Jiang; John Spence; J. Wu

doi:10.1017/S1431927606062246

Background intensity problems in high resolution defect imaging

A. Howie, N. Jiang, John Spence, J. Wu

Physics

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	900-901
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606062246
State	Published - Aug 2006

ASJC Scopus subject areas

Instrumentation

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@article{b02ea8a893c14d0a99d96db88ddb2394,

title = "Background intensity problems in high resolution defect imaging",

author = "A. Howie and N. Jiang and John Spence and J. Wu",

year = "2006",

month = aug,

doi = "10.1017/S1431927606062246",

language = "English (US)",

volume = "12",

pages = "900--901",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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}

TY - JOUR

T1 - Background intensity problems in high resolution defect imaging

AU - Howie, A.

AU - Jiang, N.

AU - Spence, John

AU - Wu, J.

PY - 2006/8

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VL - 12

SP - 900

EP - 901

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Background intensity problems in high resolution defect imaging

ASJC Scopus subject areas

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