One of the problems of automatically measuring lifetime using the Zerbst technique is the estimation of the total time required for measurement. The paper addresses this problem, and the proposed method is applicable to both uniformly and nonuniformly doped samples. This enables the data to be measured in a manner which ensures that noise free plots are obtained.
|Original language||English (US)|
|Number of pages||7|
|Journal||IEE Proceedings I: Solid State and Electron Devices|
|State||Published - Jan 1 1987|
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