Automated test development and test time reduction for RF subsystems

Sule Ozev, Alex Orailoglu, Hosam Haggag

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

Increasing percentage of test cost within the overall manufacturing cost for RF sub-systems results in a need for new, low-cost, and efficient test development methods. A methodology for automating test development for RF systems is presented. Test time reduction is achieved by selecting test signal attributes that can target several parameters at once. Due to its high computational efficiency, the tool can be applied multiple times at early design stages; thus enabling parallel test and design flow.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
Volume1
StatePublished - 2002
Externally publishedYes
Event2002 IEEE International Symposium on Circuits and Systems - Phoenix, AZ, United States
Duration: May 26 2002May 29 2002

Other

Other2002 IEEE International Symposium on Circuits and Systems
CountryUnited States
CityPhoenix, AZ
Period5/26/025/29/02

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Ozev, S., Orailoglu, A., & Haggag, H. (2002). Automated test development and test time reduction for RF subsystems. In Proceedings - IEEE International Symposium on Circuits and Systems (Vol. 1)