Abstract
Increasing percentage of test cost within the overall manufacturing cost for RF sub-systems results in a need for new, low-cost, and efficient test development methods. A methodology for automating test development for RF systems is presented. Test time reduction is achieved by selecting test signal attributes that can target several parameters at once. Due to its high computational efficiency, the tool can be applied multiple times at early design stages; thus enabling parallel test and design flow.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 1 |
| State | Published - 2002 |
| Externally published | Yes |
| Event | 2002 IEEE International Symposium on Circuits and Systems - Phoenix, AZ, United States Duration: May 26 2002 → May 29 2002 |
Other
| Other | 2002 IEEE International Symposium on Circuits and Systems |
|---|---|
| Country/Territory | United States |
| City | Phoenix, AZ |
| Period | 5/26/02 → 5/29/02 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials