Automated generation of inspection routines for SMD components

Jesus Villalobos, Hugo C. Garcia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Automated Visual Inspection (AVI) systems are nowadays considered an integral part in the assembly of Surface Mounted Devices (SMDs) in the electronics industry. This industry has faced the problem of rapid introduction and retirement of SMD based products with the consequent obsolescence of the inspection systems already in the production line. The general goal of this research is to develop a self-training system for the inspection of SMD components. In this paper we describe the general methodology being followed to develop such a system and in particular in the methodology being used for the first part of the process, i.e., automated feature selection. The objective of the feature selection process is to reduce the computational time and cost of the inspection systems such that the set of features selected minimizes the inspection errors of the systems in the inspection phase.

Original languageEnglish (US)
Title of host publicationIIE Annual Conference and Exposition 2005
StatePublished - 2005
EventIIE Annual Conference and Exposition 2005 - Atlanta, GA, United States
Duration: May 14 2005May 18 2005

Other

OtherIIE Annual Conference and Exposition 2005
CountryUnited States
CityAtlanta, GA
Period5/14/055/18/05

Fingerprint

Surface mount technology
Inspection
Feature extraction
Obsolescence
Electronics industry
Costs
Industry

Keywords

  • Automated Visual Inspection (AVI)
  • Feature Selection
  • Quadratic Vector Classifier
  • Self-Training Classifier

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Villalobos, J., & Garcia, H. C. (2005). Automated generation of inspection routines for SMD components. In IIE Annual Conference and Exposition 2005

Automated generation of inspection routines for SMD components. / Villalobos, Jesus; Garcia, Hugo C.

IIE Annual Conference and Exposition 2005. 2005.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Villalobos, J & Garcia, HC 2005, Automated generation of inspection routines for SMD components. in IIE Annual Conference and Exposition 2005. IIE Annual Conference and Exposition 2005, Atlanta, GA, United States, 5/14/05.
Villalobos J, Garcia HC. Automated generation of inspection routines for SMD components. In IIE Annual Conference and Exposition 2005. 2005
Villalobos, Jesus ; Garcia, Hugo C. / Automated generation of inspection routines for SMD components. IIE Annual Conference and Exposition 2005. 2005.
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