Atomic species identification in STM using an imaging atom-probe technique

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

In this paper we report new experimental results with the scanning tunneling atom probe (STAP), a new instrument that combines the functions of a scanning tunneling microscope (STM) and a time-of-flight atom probe. In STM-mode, clusters of atoms are transferred from regions of interest to the tip, from which they are ejected into a time-of-flight spectrometer for species identification. Improvements to the instrument and experimental results with in situ grown germanium layers on Si(111)-(7×7) are shown. Problems with the atom transfer and possible remedies are discussed.

Original languageEnglish (US)
Pages (from-to)267-279
Number of pages13
JournalSurface Science
Volume398
Issue number1-2
StatePublished - 1998

Fingerprint

Microscopes
microscopes
Scanning
Imaging techniques
Atoms
scanning
probes
atoms
Germanium
time of flight spectrometers
Spectrometers
germanium

Keywords

  • Adatoms
  • Field evaporation
  • Germanium
  • Low index single crystal surfaces
  • Scanning tunneling microscopy
  • Semiconductor-semiconductor heterostructures
  • Silicon
  • Silver

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Atomic species identification in STM using an imaging atom-probe technique. / Weierstall, Uwe; Spence, John.

In: Surface Science, Vol. 398, No. 1-2, 1998, p. 267-279.

Research output: Contribution to journalArticle

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