Atomic species identification in scanning tunneling microscopy by time-of-flight spectroscopy

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We report the first chemical identification of a cluster of atoms from identifiable sites on an extended crystal surface. The instrument used combines the functions of a scanning tunneling microscope (STM) with a time-of-flight (TOF) atom probe. Atoms are transferred from regions of interest identified in STM images to the tip, from which they are ejected into a TOF spectrometer. Preliminary results are shown in which a cluster of silicon atoms taken from the Si(111)7×7 surface is identified by TOF spectra. Applications of these "atomic tweezers" for microanalysis are discussed.

Original languageEnglish (US)
Pages (from-to)1587-1590
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume14
Issue number3
StatePublished - May 1996

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Scanning tunneling microscopy
scanning tunneling microscopy
Spectroscopy
Atoms
spectroscopy
atoms
Microscopes
microscopes
Scanning
time of flight spectrometers
scanning
Microanalysis
microanalysis
crystal surfaces
Spectrometers
Silicon
Crystals
probes
silicon

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)
  • Surfaces and Interfaces

Cite this

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title = "Atomic species identification in scanning tunneling microscopy by time-of-flight spectroscopy",
abstract = "We report the first chemical identification of a cluster of atoms from identifiable sites on an extended crystal surface. The instrument used combines the functions of a scanning tunneling microscope (STM) with a time-of-flight (TOF) atom probe. Atoms are transferred from regions of interest identified in STM images to the tip, from which they are ejected into a TOF spectrometer. Preliminary results are shown in which a cluster of silicon atoms taken from the Si(111)7×7 surface is identified by TOF spectra. Applications of these {"}atomic tweezers{"} for microanalysis are discussed.",
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AU - Weierstall, Uwe

AU - Lo, W.

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AB - We report the first chemical identification of a cluster of atoms from identifiable sites on an extended crystal surface. The instrument used combines the functions of a scanning tunneling microscope (STM) with a time-of-flight (TOF) atom probe. Atoms are transferred from regions of interest identified in STM images to the tip, from which they are ejected into a TOF spectrometer. Preliminary results are shown in which a cluster of silicon atoms taken from the Si(111)7×7 surface is identified by TOF spectra. Applications of these "atomic tweezers" for microanalysis are discussed.

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