Atomic site determination using the channeling effect in electron-induced x-ray emission

J. Taftø, John Spence

Research output: Contribution to journalArticlepeer-review

53 Scopus citations

Abstract

The variation of the characteristic X-ray emission from a thin crystal with crystallographic direction of the incident electron beam has proved to be a powerful effect for the determination of the crystallographic position of atoms with similar atomic numbers and low concentrations of atoms. The studies of a Al2ZnO4 spinel containing 3% Fe and 0.3% Mn, i.e. small concentrations of neighbours in the periodic system, will be presented. It is concluded that 62±2% of the Fe atoms and 97±10% of the Mn atoms are in tetrahedral positions. The high sensitivity of the method suggests that it is possible to determine the position of a monolayer or less of adatoms on a crystal surface. This possibility is discussed.

Original languageEnglish (US)
Pages (from-to)243-247
Number of pages5
JournalUltramicroscopy
Volume9
Issue number3
DOIs
StatePublished - 1982

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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