Atomic resolution transmission electron microscopy

Angus I. Kirkland, Shery L.Y. Chang, John L. Hutchison

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

This chapter provides an overview of the essential theory and instrumentation relevant to high-resolution imaging in the transmission electron microscope together with selected application examples. It begins with a brief historical overview of the field. Subsequently, the theory of image formation and resolution limits are discussed. We then discuss the effects of the objective lens through the wave aberration function and coherence of the electron source. In the third section, the key instrument components important for HRTEM imaging are discussed; namely, the objective lens, electron sources and monochromators, energy filters and detectors. The theory and experimental implementation of exit wavefunction reconstruction from HRTEM images is detailed in the fourth section, including examples taken from studies of complex oxides. The final section treats the simulation of HRTEM images with particular reference to the widely adopted multislice method.

Original languageEnglish (US)
Title of host publicationSpringer Handbooks
PublisherSpringer
Pages3-47
Number of pages45
DOIs
StatePublished - Jan 1 2019

Publication series

NameSpringer Handbooks
ISSN (Print)2522-8692
ISSN (Electronic)2522-8706

Fingerprint

electron sources
transmission electron microscopy
lenses
monochromators
aberration
electron microscopes
filters
oxides
high resolution
detectors
simulation
energy

ASJC Scopus subject areas

  • General

Cite this

Kirkland, A. I., Chang, S. L. Y., & Hutchison, J. L. (2019). Atomic resolution transmission electron microscopy. In Springer Handbooks (pp. 3-47). (Springer Handbooks). Springer. https://doi.org/10.1007/978-3-030-00069-1_1

Atomic resolution transmission electron microscopy. / Kirkland, Angus I.; Chang, Shery L.Y.; Hutchison, John L.

Springer Handbooks. Springer, 2019. p. 3-47 (Springer Handbooks).

Research output: Chapter in Book/Report/Conference proceedingChapter

Kirkland, AI, Chang, SLY & Hutchison, JL 2019, Atomic resolution transmission electron microscopy. in Springer Handbooks. Springer Handbooks, Springer, pp. 3-47. https://doi.org/10.1007/978-3-030-00069-1_1
Kirkland AI, Chang SLY, Hutchison JL. Atomic resolution transmission electron microscopy. In Springer Handbooks. Springer. 2019. p. 3-47. (Springer Handbooks). https://doi.org/10.1007/978-3-030-00069-1_1
Kirkland, Angus I. ; Chang, Shery L.Y. ; Hutchison, John L. / Atomic resolution transmission electron microscopy. Springer Handbooks. Springer, 2019. pp. 3-47 (Springer Handbooks).
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