Atomic-resolution structure imaging of defects and interfaces in compound semiconductors

Engineering & Materials Science

• Semiconductor materials 100%
• Heterojunctions 98%
• Imaging techniques 86%
• Defects 77%
• Electron microscopes 71%
• Stacking faults 53%
• Semiconductor devices 44%
• Thin films 35%

Chemical Compounds

• Semiconductor 85%
• Interfacial Defect 62%
• Twin Boundary 59%
• Stacking Fault 51%
• Electron Particle 40%
• Sample Preparation 31%
• Application 11%

Physics & Astronomy

• defects 62%
• electron microscopes 59%
• semiconductor devices 38%
• atomic structure 37%
• crystal defects 37%
• preparation 27%
• requirements 25%
• thin films 19%