Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope

Christian Dwyer

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Scopus citations

Abstract

In recent years, advances in scanning transmission electron microscopy instrumentation and technique have made it possible to perform core-level spectroscopy of materials at atomic spatial resolution. The implications of such a technique for materials science are far-reaching, with numerous recent works already demonstrating the ability to obtain previously inaccessible information on a variety of materials systems. This chapter provides an account of the recent advances in instrumentation, data processing, and theory that have made atomic-resolution core-level spectroscopy a practical tool for advanced materials characterization.

Original languageEnglish (US)
Title of host publicationAdvances in Imaging and Electron Physics
PublisherAcademic Press Inc
Pages145-199
Number of pages55
ISBN (Print)9780124076709
DOIs
StatePublished - 2013
Externally publishedYes

Publication series

NameAdvances in Imaging and Electron Physics
Volume175
ISSN (Print)1076-5670

Keywords

  • Scanning transmission electron microscopy
  • chemical mapping, atomic resolution
  • electron energy loss spectroscopy
  • energy dispersive x-ray spectroscopy

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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