Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Citations (Scopus)

Abstract

In recent years, advances in scanning transmission electron microscopy instrumentation and technique have made it possible to perform core-level spectroscopy of materials at atomic spatial resolution. The implications of such a technique for materials science are far-reaching, with numerous recent works already demonstrating the ability to obtain previously inaccessible information on a variety of materials systems. This chapter provides an account of the recent advances in instrumentation, data processing, and theory that have made atomic-resolution core-level spectroscopy a practical tool for advanced materials characterization.

Original languageEnglish (US)
Title of host publicationAdvances in Imaging and Electron Physics
Pages145-199
Number of pages55
Volume175
DOIs
StatePublished - 2013
Externally publishedYes

Publication series

NameAdvances in Imaging and Electron Physics
Volume175
ISSN (Print)10765670

Fingerprint

Core levels
Electron microscopes
electron microscopes
Spectroscopy
Scanning
scanning
materials science
spectroscopy
spatial resolution
Materials science
transmission electron microscopy
scanning electron microscopy
Transmission electron microscopy
Scanning electron microscopy

Keywords

  • chemical mapping, atomic resolution
  • electron energy loss spectroscopy
  • energy dispersive x-ray spectroscopy
  • Scanning transmission electron microscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Nuclear and High Energy Physics

Cite this

Dwyer, C. (2013). Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope. In Advances in Imaging and Electron Physics (Vol. 175, pp. 145-199). (Advances in Imaging and Electron Physics; Vol. 175). https://doi.org/10.1016/B978-0-12-407670-9.00003-2

Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope. / Dwyer, Christian.

Advances in Imaging and Electron Physics. Vol. 175 2013. p. 145-199 (Advances in Imaging and Electron Physics; Vol. 175).

Research output: Chapter in Book/Report/Conference proceedingChapter

Dwyer, C 2013, Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope. in Advances in Imaging and Electron Physics. vol. 175, Advances in Imaging and Electron Physics, vol. 175, pp. 145-199. https://doi.org/10.1016/B978-0-12-407670-9.00003-2
Dwyer C. Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope. In Advances in Imaging and Electron Physics. Vol. 175. 2013. p. 145-199. (Advances in Imaging and Electron Physics). https://doi.org/10.1016/B978-0-12-407670-9.00003-2
Dwyer, Christian. / Atomic-resolution core-level spectroscopy in the scanning transmission electron microscope. Advances in Imaging and Electron Physics. Vol. 175 2013. pp. 145-199 (Advances in Imaging and Electron Physics).
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