Atomic properties of N2O4 based on its experimental charge density

Marc Messerschmidt, Armin Wagner, Ming Wah Wong, Peter Luger

Research output: Contribution to journalArticle

55 Citations (Scopus)

Abstract

Nitrogen dioxide, being known to exist as a dimer N2O4 in the crystal with a very long N-N bond length of 1.76 Å, was crystallized at low-temperature conditions on a diffractometer. High-resolution X-ray data (sin(θ/λ) = 1.249 Å-1) were recorded with a CCD area detector to allow the generation of an experimental charge density distribution. By making use of Bader's AIM theory, zero-flux surfaces were calculated, and we examined atomic volumes and atomic charges obtained from this experiment and various theoretical calculations. Four commonly used methods of computing atomic charges (Mulliken, AIM, NPA, and CHELP) were considered. The AIM charges are rather independent from the used basis set. Interestingly, the evaluated atomic volumes are very similar between experiment and theory, although in theory isolated molecules are considered. For the long N-N bond a bond order n of approximately 0.5 was derived from a comparison with appropriate model compounds.

Original languageEnglish (US)
Pages (from-to)732-733
Number of pages2
JournalJournal of the American Chemical Society
Volume124
Issue number5
DOIs
StatePublished - Feb 6 2002
Externally publishedYes

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Nitrogen Dioxide
Charge density
X-Rays
Temperature
Diffractometers
Bond length
Charge coupled devices
Dimers
Experiments
Fluxes
Nitrogen
Detectors
X rays
Crystals
Molecules

ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

Cite this

Atomic properties of N2O4 based on its experimental charge density. / Messerschmidt, Marc; Wagner, Armin; Wong, Ming Wah; Luger, Peter.

In: Journal of the American Chemical Society, Vol. 124, No. 5, 06.02.2002, p. 732-733.

Research output: Contribution to journalArticle

Messerschmidt, Marc ; Wagner, Armin ; Wong, Ming Wah ; Luger, Peter. / Atomic properties of N2O4 based on its experimental charge density. In: Journal of the American Chemical Society. 2002 ; Vol. 124, No. 5. pp. 732-733.
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