Atomic imaging of surfaces by electron microscopy

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

Electron microscopes with atomic resolution have recently been used to study surfaces and to observe surface processes in real-time. The role of image simulations in confirming the interpretation of surface profile images is discussed and recent applications of the profile imaging technique to study semiconductors, oxides, the oxidation of metals, and small metal particles are briefly reviewed. Finally, the accumulation of metal deposits on some oxide and semiconductor surfaces due to electron-stimulated desorption processes is described.

Original languageEnglish (US)
Pages (from-to)462-474
Number of pages13
JournalSurface Science
Volume178
Issue number1-3
DOIs
StatePublished - Dec 3 1986

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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