Atomic force microscopy of DNA on mica and chemically modified mica

T. Thundat, D. P. Allison, R. J. Warmack, G. M. Brown, K. B. Jacobson, J. J. Schrick, T. L. Ferrell, E. Henderson, W. Heckl, S. M. Lindsay

Research output: Contribution to journalArticle

82 Scopus citations

Abstract

Atomic force microscopy (AFM) was used to image circular DNA adsorbed on freshly cleaved mica and mica chemically modified with Mg(II), Co(II), La(III), and Zr(IV). Images obtained on unmodified mica show coiling of DNA due to forces involved during the drying process. The coiling or super twisting appeared to be right handed and the extent of super twisting could be controlled by the drying conditions. Images of DNA observed on chemically modified surfaces show isolated open circular DNA that is free from super twisting, presumably due to strong binding of DNA on chemically modified surfaces.

Original languageEnglish (US)
Pages (from-to)911-918
Number of pages8
JournalScanning Microscopy
Volume6
Issue number4
StatePublished - Dec 1 1992
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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    Thundat, T., Allison, D. P., Warmack, R. J., Brown, G. M., Jacobson, K. B., Schrick, J. J., Ferrell, T. L., Henderson, E., Heckl, W., & Lindsay, S. M. (1992). Atomic force microscopy of DNA on mica and chemically modified mica. Scanning Microscopy, 6(4), 911-918.