Artificial immune systems in industrial applications

Dipankar Dasgupta, Stephanie Forrest

Research output: Chapter in Book/Report/Conference proceedingConference contribution

158 Scopus citations

Abstract

Artificial Immune System (AIS) is a new intelligent problem-solving technique that is being used in some industrial applications. This paper presents an immunity-based algorithm for tool breakage detection. The method is inspired by the negative-selection mechanism of the immune system, which is able to discriminate between the self (body elements) and the non-self (foreign pathogens). However, in our industrial application, the self is defined to be normal cutting operations and the non-self is any deviation beyond allowable variations of the cutting force. The proposed algorithm is illustrated with a simulation study of milling operations. The performance of the algorithm in detecting the occurrence of tool breakage is reported. The results show that the negative-selection algorithm detected tool breakage in all test cases.

Original languageEnglish (US)
Title of host publicationProceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
EditorsMarcello M. Veiga, John A. Meech, Michael H. Smith, Steven R. LeClair
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages257-267
Number of pages11
Volume1
ISBN (Electronic)0780354893, 9780780354890
DOIs
StatePublished - Jan 1 1999
Externally publishedYes
Event2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 - Honolulu, United States
Duration: Jul 10 1999Jul 15 1999

Other

Other2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
CountryUnited States
CityHonolulu
Period7/10/997/15/99

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Materials Science (miscellaneous)

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  • Cite this

    Dasgupta, D., & Forrest, S. (1999). Artificial immune systems in industrial applications. In M. M. Veiga, J. A. Meech, M. H. Smith, & S. R. LeClair (Eds.), Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 (Vol. 1, pp. 257-267). [792486] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPMM.1999.792486