Approximating the age of RF/analog circuits through re-characterization and statistical estimation

Doohwang Chang, Sule Ozev, Ozgur Sinanoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Counterfeit ICs have become an issue for semiconductor manufacturers due to impacts on their reputation and lost revenue. Counterfeit ICs are either products that are intentionally mislabeled or legitimate products that are extracted from electronic waste. The former is easier to detect whereas the latter is harder since they are identical to new devices but display degraded performance due to environmental and use stress conditions. Detecting counterfeit ICs that are extracted from electronic waste requires an approach that can approximate the age of manufactured devices based on their parameters. In this paper, we present a methodology that uses information on both fresh and aged ICs and tries to distinguish between the fresh and aged population based on an estimate of the age. Since analog devices age mainly due to their bias stress, input signals play less of a role. Hence, it is possible to use simulation models to approximate the aging process, which would give us access to a large population of aged devices. Using this information, we can construct a statistical model that approximates the age of a given circuit. We use a Low noise amplifier (LNA) and an NMOS LC oscillator to demonstrate that individual aged devices can be accurately classified using the proposed method.

Original languageEnglish (US)
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9783981537024
DOIs
StatePublished - 2014
Event17th Design, Automation and Test in Europe, DATE 2014 - Dresden, Germany
Duration: Mar 24 2014Mar 28 2014

Other

Other17th Design, Automation and Test in Europe, DATE 2014
CountryGermany
CityDresden
Period3/24/143/28/14

Fingerprint

Analog circuits
Low noise amplifiers
Information use
Aging of materials
Display devices
Semiconductor materials
Networks (circuits)
Electronic Waste
Statistical Models

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Chang, D., Ozev, S., Sinanoglu, O., & Karri, R. (2014). Approximating the age of RF/analog circuits through re-characterization and statistical estimation. In Proceedings -Design, Automation and Test in Europe, DATE [6800249] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.7873/DATE2014.048

Approximating the age of RF/analog circuits through re-characterization and statistical estimation. / Chang, Doohwang; Ozev, Sule; Sinanoglu, Ozgur; Karri, Ramesh.

Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc., 2014. 6800249.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chang, D, Ozev, S, Sinanoglu, O & Karri, R 2014, Approximating the age of RF/analog circuits through re-characterization and statistical estimation. in Proceedings -Design, Automation and Test in Europe, DATE., 6800249, Institute of Electrical and Electronics Engineers Inc., 17th Design, Automation and Test in Europe, DATE 2014, Dresden, Germany, 3/24/14. https://doi.org/10.7873/DATE2014.048
Chang D, Ozev S, Sinanoglu O, Karri R. Approximating the age of RF/analog circuits through re-characterization and statistical estimation. In Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc. 2014. 6800249 https://doi.org/10.7873/DATE2014.048
Chang, Doohwang ; Ozev, Sule ; Sinanoglu, Ozgur ; Karri, Ramesh. / Approximating the age of RF/analog circuits through re-characterization and statistical estimation. Proceedings -Design, Automation and Test in Europe, DATE. Institute of Electrical and Electronics Engineers Inc., 2014.
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