Approaching atomic-resolution electron microscopy

David J. Smith; R. A. Camps; L. A. Freeman; M. A. O'Keefe; W. O. Saxton; G. J. Wood

doi:10.1016/0304-3991(85)90122-6

Approaching atomic-resolution electron microscopy

David J. Smith, R. A. Camps, L. A. Freeman, M. A. O'Keefe, W. O. Saxton, G. J. Wood

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

The Cambridge University 600 kV high-resolution electron microscope, supported by local facilities for image simulation and processing, has been successfully used to characterise the microstructure of a wide range of materials at resolutions on, or approaching, the atomic scale. After short descriptions of the microscope and computer facilities, attention is first directed towards the problems of imaging artefacts and beam misalignment. The usefulness of Weak-Phase-Object images for preliminary assessments of image detail, such as dumbbells and possible oxygen atom resolution, is stressed. It is shown that the well-known imaging artefact, namely dumbbells, is an interference phenomenon which can be generated even when the crystal being imaged does not have the classic "atom-pair" projected structure. Methods for assessing resolving power and the validity of information beyond the resolution limit are considered. Particular applications to the study of surface rearrangements, nonstoichiometric rutile and defect annealing in cadmium telluride are briefly described.

Original language	English (US)
Pages (from-to)	63-75
Number of pages	13
Journal	Ultramicroscopy
Volume	18
Issue number	1-4
DOIs	https://doi.org/10.1016/0304-3991(85)90122-6
State	Published - 1985
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(85)90122-6

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title = "Approaching atomic-resolution electron microscopy",

abstract = "The Cambridge University 600 kV high-resolution electron microscope, supported by local facilities for image simulation and processing, has been successfully used to characterise the microstructure of a wide range of materials at resolutions on, or approaching, the atomic scale. After short descriptions of the microscope and computer facilities, attention is first directed towards the problems of imaging artefacts and beam misalignment. The usefulness of Weak-Phase-Object images for preliminary assessments of image detail, such as dumbbells and possible oxygen atom resolution, is stressed. It is shown that the well-known imaging artefact, namely dumbbells, is an interference phenomenon which can be generated even when the crystal being imaged does not have the classic {"}atom-pair{"} projected structure. Methods for assessing resolving power and the validity of information beyond the resolution limit are considered. Particular applications to the study of surface rearrangements, nonstoichiometric rutile and defect annealing in cadmium telluride are briefly described.",

author = "Smith, {David J.} and Camps, {R. A.} and Freeman, {L. A.} and O'Keefe, {M. A.} and Saxton, {W. O.} and Wood, {G. J.}",

note = "Funding Information: This work has been supported by the Science and Engineering Research Council (UK). We are grateful to many friends and colleagues for their valuable collaborations, and we would particularly like to thank Dr. V.E. Cosslett and Dr. W.M. Stobbs for their advice, support and encouragement throughout this work and Dr. K,C.A. Smith and Dr. S.J. Erasmus for their involvement with the on-line processing work. Copyright: Copyright 2014 Elsevier B.V., All rights reserved.",

year = "1985",

doi = "10.1016/0304-3991(85)90122-6",

language = "English (US)",

volume = "18",

pages = "63--75",

journal = "Ultramicroscopy",

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AU - Smith, David J.

AU - Camps, R. A.

AU - Freeman, L. A.

AU - O'Keefe, M. A.

AU - Saxton, W. O.

AU - Wood, G. J.

N1 - Funding Information: This work has been supported by the Science and Engineering Research Council (UK). We are grateful to many friends and colleagues for their valuable collaborations, and we would particularly like to thank Dr. V.E. Cosslett and Dr. W.M. Stobbs for their advice, support and encouragement throughout this work and Dr. K,C.A. Smith and Dr. S.J. Erasmus for their involvement with the on-line processing work. Copyright: Copyright 2014 Elsevier B.V., All rights reserved.

PY - 1985

Y1 - 1985

N2 - The Cambridge University 600 kV high-resolution electron microscope, supported by local facilities for image simulation and processing, has been successfully used to characterise the microstructure of a wide range of materials at resolutions on, or approaching, the atomic scale. After short descriptions of the microscope and computer facilities, attention is first directed towards the problems of imaging artefacts and beam misalignment. The usefulness of Weak-Phase-Object images for preliminary assessments of image detail, such as dumbbells and possible oxygen atom resolution, is stressed. It is shown that the well-known imaging artefact, namely dumbbells, is an interference phenomenon which can be generated even when the crystal being imaged does not have the classic "atom-pair" projected structure. Methods for assessing resolving power and the validity of information beyond the resolution limit are considered. Particular applications to the study of surface rearrangements, nonstoichiometric rutile and defect annealing in cadmium telluride are briefly described.

AB - The Cambridge University 600 kV high-resolution electron microscope, supported by local facilities for image simulation and processing, has been successfully used to characterise the microstructure of a wide range of materials at resolutions on, or approaching, the atomic scale. After short descriptions of the microscope and computer facilities, attention is first directed towards the problems of imaging artefacts and beam misalignment. The usefulness of Weak-Phase-Object images for preliminary assessments of image detail, such as dumbbells and possible oxygen atom resolution, is stressed. It is shown that the well-known imaging artefact, namely dumbbells, is an interference phenomenon which can be generated even when the crystal being imaged does not have the classic "atom-pair" projected structure. Methods for assessing resolving power and the validity of information beyond the resolution limit are considered. Particular applications to the study of surface rearrangements, nonstoichiometric rutile and defect annealing in cadmium telluride are briefly described.

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Approaching atomic-resolution electron microscopy

Abstract

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