Abstract

Modern experimental techniques for static convergent beam electron microdiffraction in transmission electron microscopes are discussed and compared to the better known selected area electron microdiffraction methods. The effects of probe coherence are qualitatively discussed. Some recent applications of convergent beam microdiffraction to microstructural characterization of small particles, various lattice defects and amorphous solids are described. 1984 Blackwell Science Ltd

Original languageEnglish (US)
Pages (from-to)165-178
Number of pages14
JournalJournal of Microscopy
Volume136
Issue number2
DOIs
StatePublished - 1984

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Keywords

  • materials science
  • Microdiffraction
  • microstructure
  • transmission electron microscopy

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

Cite this

Applications of modern microdiffraction to materials science. / Carpenter, Ray; Spence, John.

In: Journal of Microscopy, Vol. 136, No. 2, 1984, p. 165-178.

Research output: Contribution to journalArticle

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