Abstract
Modern experimental techniques for static convergent beam electron microdiffraction in transmission electron microscopes are discussed and compared to the better known selected area electron microdiffraction methods. The effects of probe coherence are qualitatively discussed. Some recent applications of convergent beam microdiffraction to microstructural characterization of small particles, various lattice defects and amorphous solids are described. 1984 Blackwell Science Ltd
Original language | English (US) |
---|---|
Pages (from-to) | 165-178 |
Number of pages | 14 |
Journal | Journal of Microscopy |
Volume | 136 |
Issue number | 2 |
DOIs | |
State | Published - Nov 1984 |
Keywords
- Microdiffraction
- materials science
- microstructure
- transmission electron microscopy
ASJC Scopus subject areas
- Pathology and Forensic Medicine
- Histology