Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures

Lawrence F. Allard, Karren L. More, Jimmy Liu

Research output: Contribution to journalArticlepeer-review

5 Scopus citations
Original languageEnglish (US)
Pages (from-to)130-131
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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