Applications of electron microscopy in collaborative industrial research

F. M. Ross; K. M. Krishnan; N. Thangaraj; R. F.C. Farrow; R. F. Marks; A. Cebollada; S. S.P. Parkin; M. F. Toney; M. Huffman; C. A. Paz De Araujo; L. D. McMillan; J. Cuchiaro; M. C. Scott; C. Echer; F. Ponce; M. A. O'Keefe; E. G. Nelson

doi:10.1557/S0883769400035466

Applications of electron microscopy in collaborative industrial research

F. M. Ross, K. M. Krishnan, N. Thangaraj, R. F.C. Farrow, R. F. Marks, A. Cebollada, S. S.P. Parkin, M. F. Toney, M. Huffman, C. A. Paz De Araujo, L. D. McMillan, J. Cuchiaro, M. C. Scott, C. Echer, F. Ponce, M. A. O'Keefe, E. G. Nelson

Research output: Contribution to journal › Article

10 Scopus citations

Original language	English (US)
Pages (from-to)	17-23
Number of pages	7
Journal	MRS Bulletin
Volume	21
Issue number	5
DOIs	https://doi.org/10.1557/S0883769400035466
State	Published - May 1996
Externally published	Yes

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Physical and Theoretical Chemistry

Access to Document

10.1557/S0883769400035466

Cite this

Ross, F. M., Krishnan, K. M., Thangaraj, N., Farrow, R. F. C., Marks, R. F., Cebollada, A., Parkin, S. S. P., Toney, M. F., Huffman, M., Paz De Araujo, C. A., McMillan, L. D., Cuchiaro, J., Scott, M. C., Echer, C., Ponce, F., O'Keefe, M. A., & Nelson, E. G. (1996). Applications of electron microscopy in collaborative industrial research. MRS Bulletin, 21(5), 17-23. https://doi.org/10.1557/S0883769400035466

Applications of electron microscopy in collaborative industrial research. / Ross, F. M.; Krishnan, K. M.; Thangaraj, N.; Farrow, R. F.C.; Marks, R. F.; Cebollada, A.; Parkin, S. S.P.; Toney, M. F.; Huffman, M.; Paz De Araujo, C. A.; McMillan, L. D.; Cuchiaro, J.; Scott, M. C.; Echer, C.; Ponce, F.; O'Keefe, M. A.; Nelson, E. G.

In: MRS Bulletin, Vol. 21, No. 5, 05.1996, p. 17-23.

Research output: Contribution to journal › Article

Ross, FM, Krishnan, KM, Thangaraj, N, Farrow, RFC, Marks, RF, Cebollada, A, Parkin, SSP, Toney, MF, Huffman, M, Paz De Araujo, CA, McMillan, LD, Cuchiaro, J, Scott, MC, Echer, C, Ponce, F, O'Keefe, MA & Nelson, EG 1996, 'Applications of electron microscopy in collaborative industrial research', MRS Bulletin, vol. 21, no. 5, pp. 17-23. https://doi.org/10.1557/S0883769400035466

Ross, F. M. ; Krishnan, K. M. ; Thangaraj, N. ; Farrow, R. F.C. ; Marks, R. F. ; Cebollada, A. ; Parkin, S. S.P. ; Toney, M. F. ; Huffman, M. ; Paz De Araujo, C. A. ; McMillan, L. D. ; Cuchiaro, J. ; Scott, M. C. ; Echer, C. ; Ponce, F. ; O'Keefe, M. A. ; Nelson, E. G. / Applications of electron microscopy in collaborative industrial research. In: MRS Bulletin. 1996 ; Vol. 21, No. 5. pp. 17-23.

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