Applications of electron microscopy in collaborative industrial research

F. M. Ross, K. M. Krishnan, N. Thangaraj, R. F C Farrow, R. F. Marks, A. Cebollada, S. S P Parkin, M. F. Toney, M. Huffman, C. A. Paz De Araujo, L. D. McMillan, J. Cuchiaro, M. C. Scott, C. Echer, Fernando Ponce, M. A. O'Keefe, E. G. Nelson

Research output: Contribution to journal › Article

10 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)17-23
Number of pages7
JournalMRS Bulletin
Volume21
Issue number5
StatePublished - May 1996
Externally publishedYes

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Semiconducting aluminum compounds
Strontium compounds
strontium compounds
Industrial research
ferroelectric materials
Magnetic materials
Magnetoresistance
Materials science
materials science
magnetic materials
Molecular beam epitaxy
Silicon carbide
silicon carbides
Electron microscopy
Industrial applications
Ferroelectric materials
electron microscopy
Multilayers
molecular beam epitaxy

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Ross, F. M., Krishnan, K. M., Thangaraj, N., Farrow, R. F. C., Marks, R. F., Cebollada, A., ... Nelson, E. G. (1996). Applications of electron microscopy in collaborative industrial research. MRS Bulletin, 21(5), 17-23.

Applications of electron microscopy in collaborative industrial research. / Ross, F. M.; Krishnan, K. M.; Thangaraj, N.; Farrow, R. F C; Marks, R. F.; Cebollada, A.; Parkin, S. S P; Toney, M. F.; Huffman, M.; Paz De Araujo, C. A.; McMillan, L. D.; Cuchiaro, J.; Scott, M. C.; Echer, C.; Ponce, Fernando; O'Keefe, M. A.; Nelson, E. G.

In: MRS Bulletin, Vol. 21, No. 5, 05.1996, p. 17-23.

Research output: Contribution to journal › Article

Ross, FM, Krishnan, KM, Thangaraj, N, Farrow, RFC, Marks, RF, Cebollada, A, Parkin, SSP, Toney, MF, Huffman, M, Paz De Araujo, CA, McMillan, LD, Cuchiaro, J, Scott, MC, Echer, C, Ponce, F, O'Keefe, MA & Nelson, EG 1996, 'Applications of electron microscopy in collaborative industrial research', MRS Bulletin, vol. 21, no. 5, pp. 17-23.
Ross FM, Krishnan KM, Thangaraj N, Farrow RFC, Marks RF, Cebollada A et al. Applications of electron microscopy in collaborative industrial research. MRS Bulletin. 1996 May;21(5):17-23.
Ross, F. M. ; Krishnan, K. M. ; Thangaraj, N. ; Farrow, R. F C ; Marks, R. F. ; Cebollada, A. ; Parkin, S. S P ; Toney, M. F. ; Huffman, M. ; Paz De Araujo, C. A. ; McMillan, L. D. ; Cuchiaro, J. ; Scott, M. C. ; Echer, C. ; Ponce, Fernando ; O'Keefe, M. A. ; Nelson, E. G. / Applications of electron microscopy in collaborative industrial research. In: MRS Bulletin. 1996 ; Vol. 21, No. 5. pp. 17-23.
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author = "Ross, {F. M.} and Krishnan, {K. M.} and N. Thangaraj and Farrow, {R. F C} and Marks, {R. F.} and A. Cebollada and Parkin, {S. S P} and Toney, {M. F.} and M. Huffman and {Paz De Araujo}, {C. A.} and McMillan, {L. D.} and J. Cuchiaro and Scott, {M. C.} and C. Echer and Fernando Ponce and O'Keefe, {M. A.} and Nelson, {E. G.}",
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T1 - Applications of electron microscopy in collaborative industrial research

AU - Ross, F. M.

AU - Krishnan, K. M.

AU - Thangaraj, N.

AU - Farrow, R. F C

AU - Marks, R. F.

AU - Cebollada, A.

AU - Parkin, S. S P

AU - Toney, M. F.

AU - Huffman, M.

AU - Paz De Araujo, C. A.

AU - McMillan, L. D.

AU - Cuchiaro, J.

AU - Scott, M. C.

AU - Echer, C.

AU - Ponce, Fernando

AU - O'Keefe, M. A.

AU - Nelson, E. G.

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