Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials

S. Lazar, L. Y. Chang, L. Gunawan, Y. Shao, G. A. Botton

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)154-155
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009

ASJC Scopus subject areas

  • Instrumentation

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