Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials

S. Lazar, Lan-Yun Chang, L. Gunawan, Y. Shao, G. A. Botton

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)154-155
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009
Externally publishedYes

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Aberrations
stems
Nanostructured materials
aberration
Oxides
oxides

ASJC Scopus subject areas

  • Instrumentation

Cite this

Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials. / Lazar, S.; Chang, Lan-Yun; Gunawan, L.; Shao, Y.; Botton, G. A.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 01.07.2009, p. 154-155.

Research output: Contribution to journalArticle

Lazar, S. ; Chang, Lan-Yun ; Gunawan, L. ; Shao, Y. ; Botton, G. A. / Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials. In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 154-155.
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