Application of the electron density correlation function for structural analysis of X-ray scattering/diffraction information from polymer-based nano-composites

Kenan Song, Yiying Zhang, Navid Tajaddod, Marilyn L. Minus

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Modem diffraction and scattering methods of X-ray radiation allow for multi-scale probing of the material morphology for both polymer-based composite films and fibers. These approaches and analyses tools can be used to map the makeup of individual grain structures in various polymer nano-composites in order to examine the effects of the fillers on nano-scale structural changes in the materials. The electron intensity correlation function, derived from Fourier transformations of the X-ray scattering pattern provides a path to analyze acquired data for space resolved domains. Here in this study, polymer-based nano-carbon composite systems are analyzed. The polymers used include polyvinyl alcohol, polyethylene, and polyacrilonitrile as matrix materials. The nano-carbon filler contribution to the grain size evolution is tracked by Xray scattering/diffraction characterization. These results show that the relevant sizes of crystalline and amorphous domains within the lamellae structures correspond to the dispersion/distribution of the nano-filler in the composite materials. This work mainly illustrates an effective use of the correlation function to provide global morphological analysis in the composite system.

Original languageEnglish (US)
Title of host publicationState-of-the-Art Developments in Materials Characterization
EditorsYunseok Kim, Dongsheng Li, Ali Passian, Rozaliya Barabash, Ulrich Lienert, Vassilia Zorba, Klaus-Dieter Liss, Klaus-Dieter Liss, Masato Ohnuma, Renato Zenobi, Arda Genc, Aude Lereu, Olga Ovchinnikova, Liane G. Benning, Jeffrey D. Rimer, Laurene Tetard, Thomas Thundat
PublisherMaterials Research Society
Pages147-152
Number of pages6
Volume1754
ISBN (Electronic)9781605117317
DOIs
StatePublished - Jan 1 2016
Externally publishedYes
Event2014 MRS Fall Meeting - Boston, United States
Duration: Nov 30 2014Dec 5 2014

Other

Other2014 MRS Fall Meeting
CountryUnited States
CityBoston
Period11/30/1412/5/14

Fingerprint

X ray scattering
structural analysis
Structural analysis
Carrier concentration
Polymers
Diffraction
Fillers
composite materials
fillers
Composite materials
polymers
scattering
diffraction
Large scale systems
x rays
Carbon
Scattering
Polyvinyl Alcohol
Polyvinyl alcohols
Crystal microstructure

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Song, K., Zhang, Y., Tajaddod, N., & Minus, M. L. (2016). Application of the electron density correlation function for structural analysis of X-ray scattering/diffraction information from polymer-based nano-composites. In Y. Kim, D. Li, A. Passian, R. Barabash, U. Lienert, V. Zorba, K-D. Liss, K-D. Liss, M. Ohnuma, R. Zenobi, A. Genc, A. Lereu, O. Ovchinnikova, L. G. Benning, J. D. Rimer, L. Tetard, ... T. Thundat (Eds.), State-of-the-Art Developments in Materials Characterization (Vol. 1754, pp. 147-152). Materials Research Society. https://doi.org/10.1557/opl.2015.760

Application of the electron density correlation function for structural analysis of X-ray scattering/diffraction information from polymer-based nano-composites. / Song, Kenan; Zhang, Yiying; Tajaddod, Navid; Minus, Marilyn L.

State-of-the-Art Developments in Materials Characterization. ed. / Yunseok Kim; Dongsheng Li; Ali Passian; Rozaliya Barabash; Ulrich Lienert; Vassilia Zorba; Klaus-Dieter Liss; Klaus-Dieter Liss; Masato Ohnuma; Renato Zenobi; Arda Genc; Aude Lereu; Olga Ovchinnikova; Liane G. Benning; Jeffrey D. Rimer; Laurene Tetard; Thomas Thundat. Vol. 1754 Materials Research Society, 2016. p. 147-152.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Song, K, Zhang, Y, Tajaddod, N & Minus, ML 2016, Application of the electron density correlation function for structural analysis of X-ray scattering/diffraction information from polymer-based nano-composites. in Y Kim, D Li, A Passian, R Barabash, U Lienert, V Zorba, K-D Liss, K-D Liss, M Ohnuma, R Zenobi, A Genc, A Lereu, O Ovchinnikova, LG Benning, JD Rimer, L Tetard & T Thundat (eds), State-of-the-Art Developments in Materials Characterization. vol. 1754, Materials Research Society, pp. 147-152, 2014 MRS Fall Meeting, Boston, United States, 11/30/14. https://doi.org/10.1557/opl.2015.760
Song K, Zhang Y, Tajaddod N, Minus ML. Application of the electron density correlation function for structural analysis of X-ray scattering/diffraction information from polymer-based nano-composites. In Kim Y, Li D, Passian A, Barabash R, Lienert U, Zorba V, Liss K-D, Liss K-D, Ohnuma M, Zenobi R, Genc A, Lereu A, Ovchinnikova O, Benning LG, Rimer JD, Tetard L, Thundat T, editors, State-of-the-Art Developments in Materials Characterization. Vol. 1754. Materials Research Society. 2016. p. 147-152 https://doi.org/10.1557/opl.2015.760
Song, Kenan ; Zhang, Yiying ; Tajaddod, Navid ; Minus, Marilyn L. / Application of the electron density correlation function for structural analysis of X-ray scattering/diffraction information from polymer-based nano-composites. State-of-the-Art Developments in Materials Characterization. editor / Yunseok Kim ; Dongsheng Li ; Ali Passian ; Rozaliya Barabash ; Ulrich Lienert ; Vassilia Zorba ; Klaus-Dieter Liss ; Klaus-Dieter Liss ; Masato Ohnuma ; Renato Zenobi ; Arda Genc ; Aude Lereu ; Olga Ovchinnikova ; Liane G. Benning ; Jeffrey D. Rimer ; Laurene Tetard ; Thomas Thundat. Vol. 1754 Materials Research Society, 2016. pp. 147-152
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