Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Jean Paul Morniroli, Patrick Cordier, Éric Van Cappellen, Jin Min Zuo, John Spence

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science