It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.
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