Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Jean Paul Morniroli, Patrick Cordier, Éric Van Cappellen, Jin Min Zuo, John Spence

Research output: Contribution to journalArticle

4 Scopus citations


It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.

Original languageEnglish (US)
Pages (from-to)187-202
Number of pages16
JournalMicroscopy Microanalysis Microstructures
Issue number3
StatePublished - Jan 1 1997


ASJC Scopus subject areas

  • Instrumentation

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