Application of reverse bias recovery technique to address PID issue: Incompleteness of shunt resistance and quantum efficiency recovery

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

Potential Induced Degradation (PID) has recently been identified as one of the major field durability issues of PV modules. The industry is attempting to address this issue at the module/cell production level by modifying the cell, glass and/or encapsulant properties and at the system level through the application of reverse bias voltage during the nighttime. However, there is a lingering question on the full recovery of the cells through the reverse bias application technique. The results obtained in this work indicate that the near-full recovery of efficiency at high irradiance levels can be achieved but the full recovery of efficiency at low irradiance levels, the shunt resistance and the quantum efficiency at low wavelengths could not be achieved.

Original languageEnglish (US)
Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages925-929
Number of pages5
ISBN (Electronic)9781479943982
DOIs
StatePublished - Oct 15 2014
Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
Duration: Jun 8 2014Jun 13 2014

Publication series

Name2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Other

Other40th IEEE Photovoltaic Specialist Conference, PVSC 2014
CountryUnited States
CityDenver
Period6/8/146/13/14

Keywords

  • PID
  • durability
  • high voltage
  • quantum efficiency
  • reliability
  • shunt resistance

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Oh, J., Bowden, S., & Tamizhmani, G. (2014). Application of reverse bias recovery technique to address PID issue: Incompleteness of shunt resistance and quantum efficiency recovery. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 925-929). [6925065] (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6925065